MARK COMPRISES YC

Brand Owner Address Description
YC KABUSHIKI KAISHA YOKOWO SEISAKUSHO 5-11, TAKINOGAWA 7-CHOME KITA-KU, TOKYO Japan THE MARK COMPRISES YC AND DESIGN.;ROD ANTENNAS, ANTENNAS FOR RADIOS, ANTENNAS FOR TELEVISIONS, ANTENNAS FOR WIRELESS COMMUNICATION EQUIPMENTS, ANTENNAS FOR CAR RADIOS, RECEIVING ANTENNAS FOR SATELLITE BROADCAST; TEST PROBE FOR PRINTED CIRCUIT BOARD, INTEGRATED CIRCUIT TESTING PROBE, TEST FIXTURE TO DETERMINE THE APTITUDE OF A PRINTED CIRCUIT BOARD WITH TEST APPARATUS AND ASSEMBLY OF PROBE FOR USE IN CONNECTION THEREWITH;CY;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The present invention provides an overlay mark for aligning different layers on a semiconductor wafer. The overlay mark comprises a bar-in-bar mark and two bar sets on the semiconductor wafer. The bar-in-bar mark comprises an inner bar mark positioned in one of the pre-layer and an outer bar mark positioned in the other pre-layer. The two bar sets are perpendicular to each other, and each of two bar sets comprises two parallel bars. The bars can be connected and the lengths of the bars can be the same or different.