MEMORY MODULES CONFIGURED WITH DYNAMIC

Brand	Owner (click to sort)	Address	Description
DURAFLASH	Smart Modular Technologies, Inc.	39870 Eureka Drive Newark CA 94560	Memory Modules configured with dynamic random access memory devices having durability and reliability features, namely, thermal throttling, industrial temperature range components, conformal coatings, anti-sulfur resistors, underfills, and retention clips; Memory modules, namely, dual inline memory modules with DRAM, Flash, or DRAM and Flash combination;DURA FLASH;
DURAMEMORY	Smart Modular Technologies, Inc.	39870 Eureka Drive Newark CA 94560	Memory Modules configured with dynamic random access memory devices having durability and reliability features, namely, thermal throttling, industrial temperature range components, conformal coatings, anti-sulfur resistors, underfills, and retention clips; Memory modules, namely, dual inline memory modules with DRAM, Flash, or DRAM and Flash combination;DURA MEMORY;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A distributed, hierarchical built-in self-test (BIST) architecture for testing the operation of one or more memory modules is described. As described, the architecture includes three tiers of abstraction: a centralized BIST controller, a set of sequencers, and a set of memory interfaces coupled to memory modules. The BIST controller stores a set of commands that generically define an algorithm for testing the memory modules without regard to the physical characteristics or timing requirements of the memory modules. The sequencers receive the commands and generate sequences of memory operations in accordance with the timing requirements of the various memory modules. The memory interfaces apply the memory operations to the memory module in accordance with physical characteristics of the memory module, e.g., by translating address and data signals based on the row-column arrangement of the memory modules to achieve bit patterns described by the commands.