METROLOGY SOFTWARE USE

Brand Owner Address Description
DESIGNGAUGE-ANALYZER KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES 1-24-14 Nishi Shimbashi Minato-ku Tokyo Japan Metrology software for use in the manufacturing of semiconductors; software for the evaluation and inspection of semiconductors and semiconductor materials; software for use in processing semiconductor wafers, software for analyzing, measuring, and contouring based on electron microscope images and data;DESIGN GAUGE-ANALYZER;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method, apparatus, and a system for providing data representation associated with non-sampled workpieces. Measured metrology data relating to a first workpiece is received. Metrology data corresponding to a second workpiece is approximated based upon the metrology data relating to the first workpiece to provide a projected metrology data relating to the second workpiece.