REAL TIME TEST SYSTEMS COMPRISING

Brand Owner Address Description
AIDASS AIRBUS DEFENCE AND SPACE GMBH Willy-Messerschmitt-Str. 1 Taufkirchen 82024 Germany Real time test systems comprising computer hardware and software for integration testing, on-ground testing and in-flight testing of electronic equipment and their parts, namely, for testing of data input, data recording, data evaluation, and data indication equipment, data busses and data bus systems, analogue-to- digital and digital-to-analogue converters, program scanners, simulators for simulation of mechanical, electrical, and electronic functions and sequences, interconnection modules, data generators, data analyzers, and electronic selection and coordination switches, interfaces, namely, data bus, analogue, digital and discrete interfaces; Control equipment for integration test, on-ground test and in-flight test equipment as well as programs stored on data carriers to be used for that control equipment; integration test, on-ground test and in-flight test programs stored on data carriers; Instruments, namely, computer hardware and software for simulation of electronic devices and simulation of mechanical, electrical, and electronic functions and sequences; Instruments, namely, computer hardware and software for simulation of mechanical and electrical functions and sequences; Display equipment, namely, liquid crystal displays for preparing and conducting tests of electronic devices and evaluation of test results; Software, namely, databases for control of tests of electronic devices to define the test system and check the configuration of the test system; Computer hardware and software for preparation of test documentation; Computer hardware and software for interconnection of test equipment via telecommunications media and via the Internet and local area networks;Transmission of data from test equipment via telecommunications media and via Internet and local area networks;[ Devices for transportation on ground, air, and sea, namely, automobiles, trucks, trains, airplanes, and boats ];Conducting tests of electronic devices, evaluation of tests of electronic devices; Design and development of computers and computer programs;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The invention relates to a design analysis technique for a test pattern analysis of chips via automatic test equipment (ATE) or a circuit simulation to detect potential design weakness or abnormal behavior in real customer application faults. Problems are solved by comprising a simulation procedure stored in an LRT database of automatic test equipment (ATE), defining test conditions and test patterns which execute and generate continuously for a time given by a user, applying the test stimuli and test conditions to a device under test (DUT) and starting the long running test (LRT), stopping the test automatically if any application faults occur and logging the failure time and timely test sequence and starting another test again until a given maximum number of tests are reached.