X RAY ANALYSIS APPARATUS

Brand Owner (click to sort) Address Description
AXIOS MALVERN PANALYTICAL B.V. Lelyweg 1 Almelo 7602EA Netherlands X-RAY ANALYSIS APPARATUS, NOT FOR MEDICAL USE;
CUBIX MALVERN PANALYTICAL B.V. Lelyweg 1 Almelo 7602EA Netherlands X-ray analysis apparatus, not for medical purposes;in the statement, column 1, before line 1, Koninklijke Philips Electronics N.V. (Netherlands Limited Liability Company), Groenewoudseweg 1, Eindhover, Netherlands, by change of name should be inserted.;
CUBIX Phillips Electronics N.V. Groenewoudseweg 1 Eindhoven Netherlands X-ray analysis apparatus, not for medical purposes;in the statement, column 1, before line 1, Koninklijke Philips Electronics N.V. (Netherlands Limited Liability Company), Groenewoudseweg 1, Eindhover, Netherlands, by change of name should be inserted.;
RAYNY SHIMADZU CORPORATION 1, Nishinokyo Kuwabaracho, Nakagyo-ku Kyoto 604-8511 Japan X-ray analysis apparatus, not for medical use and X-ray fluouresence spectrometers;
VENUS MINILAB PANALYTICAL B.V. Lelyweg 1 Almelo 7602 EA Netherlands X-ray analysis apparatus, not for medical purposes;MINILAB;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.