TECHNOS CO., LTD.

S-MAT

SEMICONDUCTOR THIN-FILM THICKNESS GAUGES;

T

Instructional and educational services, namely, arranging and organizing classes, seminars, working groups, research groups, conferences and conventions in the fields of manufacturing, inspecting, and analyzing semiconductors, analyzing chemical components, structurally analyzing substances, and inspecting and analyzing materials employing X-ray technology, and the distribution of printed and electronic course materials in connection therewith; publishing of electronic publications;Manufacturing of semiconductors to order and/or specification of others; information and consultancy services in the field of manufacturing semiconductors to order and/or specification of others; treatment of metals, rubber, plastic and ceramic materials; rental of chemical processing machines and apparatus;Apparatus for inspecting semiconductors; apparatus for analyzing chemical components of organic and inorganic materials; apparatus for analyzing the substance structure of organic and inorganic materials; measuring and analyzing apparatuses, namely, X-ray fluorescence spectrometers, X-ray absorption fine structure analyzing apparatus, X-ray diffractmeters, mass spectrometers, spectrophotometers, magnetic resonance apparatus, chromatograph apparatus; electron microscopes; non-medical industrial X-ray machines; non-medical X-ray apparatus for industrial use; computer programs for use in semiconductor inspection, chemical analysis and X-ray inspection or analysis; electronic publications, namely, electronic books, electronic magazines, and electronic newspapers recorded in computer recording media relating to semiconductor inspection, chemical analysis and X-ray inspection or analysis; computers;The mark consists of A stylized letter T consisting of a black colored arc which narrows as it curves to the right, a white center arc and a red, right triangular figure with a bowed side corresponding to the white and black arcs beneath it.;TECHNOS;The color(s) red, white and black is/are claimed as a feature of the mark.;Inspection and analysis of semiconductors; information and consultancy services in the fields of inspection and analysis of semiconductors, analysis of chemical components, and structural analysis of substances; analysis of chemical components for others; chemical analysis, namely, structural analysis of substances for others; technical consulting services relating to the performance and operation of apparatuses; designing of machines, apparatuses, instruments, systems and parts therefore of machines for use in the fields of manufacturing, inspecting, and analyzing semiconductors, analyzing chemical components, structurally analyzing substances, and inspecting and analyzing materials employing X-ray technology; computer software design, computer programming, and maintenance of computer software; testing, inspection and research of pharmaceuticals, cosmetics and foodstuffs; testing and research in the fields of electricity, X-ray technology, machines and apparatuses; rental of measuring and testing machines and instruments; rental of industrial X-ray machines and apparatuses; rental of computers; rental of laboratory apparatuses and instruments;

TECHNORAYS

Instructional and educational services, namely arranging and organizing classes, seminars, working groups, research groups, conferences and conventions in the fields of manufacturing, inspecting, and analyzing semiconductors, analyzing chemical components, structurally analyzing substances, and inspecting and analyzing materials employing X-ray technology, and the distribution of printed and electronic course materials in connection therewith; publishing of electronic publications;manufacturing of semiconductors to order and/or specification of others; information and consultancy services in the field of manufacturing semiconductors to order and/or specification of others; treatment of metals, rubber, plastic and ceramic materials; rental of chemical processing machines and apparatus;The mark consists of Technorays in stylized format.;Apparatus for inspecting semiconductors; apparatus for analyzing chemical components of organic and inorganic materials; apparatus for analyzing the substance structure of organic and inorganic materials; measuring and analyzing apparatuses, namely X-ray fluorescence spectrometers, X-ray absorption fine structure analyzing apparatus, X-ray diffractmeters, mass spectrometers, spectrophotometers, magnetic resonance apparatus, chromatograph apparatus; electron microscopes; non-medical industrial X-ray machines; non-medical X-ray apparatus for industrial use; computer programs for use in semiconductor inspection, chemical analysis and X-ray inspection or analysis; electronic publications, namely electronic books, electronic magazines, and electronic newspapers recorded in computer recording media relating to semiconductor inspection, chemical analysis and X-ray inspection or analysis; computers;TECHNOS RAYS;Color is not claimed as a feature of the mark.;Inspection and analysis of semiconductors; information and consultancy services in the fields of inspection and analysis of semiconductors, analysis of chemical components, and structural analysis of substances; analysis of chemical components for others; chemical analysis, namely, structural analysis of substances for others; technical consulting services relating to the performance and operation of apparatuses; designing of machines, apparatuses, instruments, systems and parts therefore of machines for use in the fields of manufacturing, inspecting, and analyzing semiconductors, analyzing chemical components, structurally analyzing substances, and inspecting and analyzing materials employing X-ray technology; computer software design, computer programming, and maintenance of computer software; testing, inspection and research of pharmaceuticals, cosmetics and foodstuffs; testing and research in the fields of electricity, X-ray technology, machines and apparatuses; rental of measuring and testing machines and instruments; rental of industrial X-ray machines and apparatuses; rental of computers; rental of laboratory apparatuses and instruments;

TECHNOS

NON-MEDICAL, SCIENTIFIC, LABORATORY AND PRODUCTION DETECTION DEVICES WHICH USE X-RAY REFLECTION FLUORESCENCE ANALYZING TECHNOLOGY AND X-RAY ABSORPTION-EDGE FINE STRUCTURE TECHNOLOGY FOR USE IN THE SEMICONDUCTOR, CATALYST CHEMISTRY, MATERIAL CHEMISTRY AND BIOCHEMISTRY INDUSTRIES WHICH ALLOW THE DETECTION, MEASUREMENT, ANALYSIS AND EVALUATION OF FILM THICKNESS OF PROPERTIES AND METALLIC CONTAMINATION ON WAFER SURFACES;

TREX

NON-MEDICAL DETECTION DEVICES WHICH USE X-RAY REFLECTION FLUORESCENCE ANALYZING TECHNOLOGY FOR THE DETECTION OF METAL CONTAMINATION, PARTICULARLY FOR USE IN CLEAN ROOMS OR SEMICONDUCTOR WAFER HANDLING ENVIRONMENTS;