APPARATUS FOR AUTOMATIC TESTING

Brand	Owner (click to sort)	Address	Description
DATA DIRECTOR	ZEHNTEL, INC.	2625 SHADELANDS WALNUT CREEK CA 94598	Apparatus for Automatic Testing of Complex LSI Integrated Circuit Components;The right to the exclusive use of the word Data is disclaimed apart from the use of the word in the mark as shown.;
PEX-O-MATIC	PECK'S PRODUCTS COMPANY	610 EAST CLARENCE AVENUE ST. LOUIS MO	APPARATUS FOR THE AUTOMATIC TESTING OF THE CONCENTRATION OF METAL TREATMENT SOLUTIONS, AND FOR MAINTAINING A PREDETERMINED CONCENTRATION THEREOF;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

The cleaning device may clean probe elements. The probe elements may be the probe elements of a probe card testing apparatus for testing semiconductor wafers or semiconductor dies on a semiconductor wafer or the probe elements of a handling/testing apparatus for testing the leads of a packaged integrated circuit. During the cleaning of the probe elements, the probe card or the handler/tester is cleaned during the normal operation of the testing machine without removing the probe card from the prober. The cleaning device has a working surface with a particular characteristic (a matte finish or a conductive material) so that a prober is capable of automatically determining the location of the working surface of the cleaning device and therefore operate in an automatic cleaning mode.