APPLIED SEMICONDUCTOR TEST SYSTEMS

Brand	Owner	Address	Description
TRANSLATED WAFER	ADVANCED INQUIRY SYSTEMS, INC.	Mail Code OGI 504 20000 NW Walker Rd Beaverton OR 97006	applied semiconductor test systems, comprised of robotics, computer hardware, and computer software for testing multiple die on semiconductor wafers;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A burn-in test, including first to sixth steps where voltages are applied for the same lengths of time in each step, is applied to a semiconductor memory having alternately arranged bit line pairs with twist structure where the bit lines cross each other and bit line pairs with non-twist structure where the bit lines are parallel to each other. Since lengths of time in which a stress is applied for all bit lines can be equally set, no deviation occurs in lengths of time where stress is applied between the bit lines. Characteristics of memory cells can be prevented from excessively deteriorating from the burn-in test. Further, the number of bit lines not having stress applied can be minimized in the first to sixth steps. Accordingly, the ratio of the bit lines having stress applied can be increased, which reduces the burn-in test time. Thus, test cost can be reduced.