AUTOMATED WAFER INSPECTION SYSTEMS COMPRISED

Brand Owner (click to sort) Address Description
ARISYS OLYMPUS OPTICAL CO., LTD. 43-2, 2-chome Hatagaya, Shibuya-ku Tokyo Japan AUTOMATED WAFER INSPECTION SYSTEMS COMPRISED OF WAFER TRANSFERRING UNIT, LOADING PORT, INSPECTION PLATFORM, STAGE, MICROSCOPE AND COMPUTER; COMPUTER SOFTWARE FOR OPERATING AUTOMATED WAFER INSPECTION SYSTEMS;
FS OLYMPUS OPTICAL CO., LTD. 43-2, 2-chome Hatagaya, Shibuya-ku Tokyo Japan AUTOMATED WAFER INSPECTION SYSTEMS COMPRISED OF COMPUTER HARDWARE, MICROSCOPES, SOFTWARE FOR USE IN THE INSPECTION OF WAFERS, LOADING PORTS, INSPECTION PLATFORMS, AND A WAFER TRANSFERRING UNIT;
FS2100 OLYMPUS OPTICAL CO., LTD. 43-2, 2-chome Hatagaya, Shibuya-ku Tokyo Japan AUTOMATED WAFER INSPECTION SYSTEMS COMPRISED OF COMPUTER HARDWARE, MICROSCOPES, SOFTWARE FOR USE IN THE INSPECTION OF WAFERS, LOADING PORTS, INSPECTION PLATFORMS, AND A WAFER TRANSFERRING UNIT;
FS3100 OLYMPUS OPTICAL CO., LTD. 43-2, 2-chome Hatagaya, Shibuya-ku Tokyo Japan AUTOMATED WAFER INSPECTION SYSTEMS COMPRISED OF COMPUTER HARDWARE, MICROSCOPES, SOFTWARE FOR USE IN THE INSPECTION OF WAFERS, LOADING PORTS, INSPECTION PLATFORMS, AND A WAFER TRANSFERRING UNIT;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Wafer inspection systems and methods are provided. One inspection system includes a module measurement cell coupled to a host inspection system by a wafer handler. The module measurement cell is configured to inspect a wafer using one or more modes prior to inspection of the wafer by the host inspection system. The one or more modes include backside inspection, edge inspection, frontside macro defect inspection, or a combination thereof. Another inspection system includes two or more low resolution electronic sensors arranged at multiple viewing angles. The sensors are configured to detect light returned from a wafer substantially simultaneously. A method for analyzing inspection data includes selecting a template corresponding to a support device that contacts a backside of a wafer prior to inspection of the backside of the wafer. The method also includes subtracting data representing the template from inspection data generated by inspection of the backside of the wafer.