AUTOMATIC TEST EQUIPMENT APPARATUS

Brand	Owner (click to sort)	Address	Description
LTX-CREDENCE	XCERRA CORPORATION	825 University Avenue Norwood MA 02062	Automatic test equipment and apparatus for testing semiconductors, printed circuit boards, electronic assemblies and related devices; automatic calibration devices for use with semiconductor test equipment; computer hardware, computer software, printed circuit board assemblies, data transmission, communications, signal and power cables, electronic instrumentation and equipment, namely, electronic monitors, sensors, interposers, digital volt meters, signal generators, oscilloscopes, and frequency generators, manipulators for use with automatic test equipment and apparatus, electrical power supplies and related parts and equipment, namely, power distribution units, power converters, relays and switches, and cooling fans for electronic equipment, all for use in the operation of test equipment and in the design, manufacture, testing, inspection, analysis, diagnosis and verification of semiconductors, integrated circuits, printed circuit boards, electronic assemblies and related devices;Installation, maintenance and repair of semiconductor test equipment;Computer and technical services, namely, semiconductor and printed circuit board testing services, design and development of semiconductor tests and test strategies, and consulting services in the field of semiconductor and circuit board testing;
LTXC	LTX-CREDENCE CORPORATION	825 University Avenue Norwood MA 02062	Automatic test equipment and apparatus for testing semiconductors, printed circuit boards, electronic assemblies and related devices; automatic calibration devices for use with semiconductor test equipment; computer hardware, computer software, printed circuit board assemblies, data transmission, communications, signal and power cables, electronic instrumentation and equipment, namely, electronic monitors, sensors, interposers, digital volt meters, signal generators, oscilloscopes, and frequency generators, manipulators for use with automatic test equipment and apparatus, electrical power supplies and related parts and equipment, namely, power distribution units, power converters, relays and switches, and cooling fans for electronic equipment, all for use in the operation of test equipment and in the design, manufacture, testing, inspection, analysis, diagnosis and verification of semiconductors, integrated circuits, printed circuit boards, electronic assemblies and related devices;Installation, maintenance and repair of semiconductor test equipment;LTX CREDENCE;Computer and technical services, namely, semiconductor and printed circuit board testing services, design and development of semiconductor tests and test strategies, and consulting services in the field of semiconductor and circuit board testing;
XCERRA	XCERRA CORPORATION	825 University Avenue Norwood MA 02062	Automatic test equipment and apparatus, namely, testing equipment for testing semiconductors; automatic calibration devices for calibrating semiconductor test equipment; computer hardware, computer software for the monitoring and control of production machines in the area of semiconductor and electronics manufacturing and testing, namely, for checking and evaluation of operating data from the semiconductor and electronics production process in the area of the final inspection of semiconductor components, computer software for creating on-line databases regarding production data obtained during semiconductor testing at variable intervals that can be freely chosen, computer software for evaluating semiconductor and electronics production data in the form of statistics;Installation, maintenance and repair of semiconductor test equipment;Computer and technical services, namely, semiconductor and printed circuit board testing services, design and development of semiconductor tests and test strategies, and consulting services in the field of semiconductor and circuit board testing and design;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

The invention relates to a design analysis technique for a test pattern analysis of chips via automatic test equipment (ATE) or a circuit simulation to detect potential design weakness or abnormal behavior in real customer application faults. Problems are solved by comprising a simulation procedure stored in an LRT database of automatic test equipment (ATE), defining test conditions and test patterns which execute and generate continuously for a time given by a user, applying the test stimuli and test conditions to a device under test (DUT) and starting the long running test (LRT), stopping the test automatically if any application faults occur and logging the failure time and timely test sequence and starting another test again until a given maximum number of tests are reached.