AUTOMATIC TEST EQUIPMENT

Brand Owner (click to sort) Address Description
BECAUSE TESTING MATTERS TERADYNE, INC. 600 Riverpark Drive North Reading MA 01864 Automatic test equipment for the electronic testing and inspection of electronic components, electronic sub assemblies, electronic assemblies and data networks;Testing services for others, namely, the electronic testing and inspection of electronic components, electronic sub assemblies, electronic assemblies and data networks;
GROUP TECHNOLOGIES GROUP TECHNOLOGIES CORPORATION 10901 Malcolm McKinley Drive Tampa FL 33612 automatic test equipment for the measurement of performance of electronic circuit cards and computer software and hardware for communications, telecommunication between computer networks, communications security, information security, network security, teleconferencing and video teleconferencing;TECHNOLOGIES;
HAMMER EMPIRIX, INC. 600 Technology Park Drive Billerica MA 01821 Automatic test equipment, namely, computer hardware for testing devices that connect to a telephone network, namely, modems, voice response units, telecommunications switching equipment, data communications equipment, and call center equipment; automatic test equipment, namely, computer hardware for testing next generation network and internet protocol multi-media subsystem network equipment, applications and networks;Providing feature testing, functional testing and load testing of hardware components and applications related to contact centers for businesses;
HAMMER EMPIRIX, INC. 600 Technology Park Drive Billerica MA 01821 Automatic test equipment, namely, computer software for testing devices that connect to a telephone network, namely, modems, voice response units, telecommunications switching equipment, data communications equipment, and call center equipment; automatic test equipment, namely, computer software for testing next generation network and internet protocol multi-media subsystem network equipment, applications and networks;Providing feature testing, functional testing and load testing of software components and applications related to contact centers for businesses;
HAMMER EDGE EMPIRIX INC. 600 Technology Park Drive Billerica MA 01821 Automatic test equipment, namely, computer hardware and software for testing next generation network and internet protocol multi-media subsystem network equipment, applications and networks;
HAMMER TECHNOLOGIES EMPIRIX, INC. 600 Technology Park Drive Billerica MA 01821 automatic test equipment, namely, computer hardware and software for testing devices that connect to a telephone network, namely, modems, voice response units, telecommunications switching equipment, data communications equipment, and call center equipment;TECHNOLOGIES;The lining shown in the drawing is a feature of the mark, and is not intended to indicate color.;
MYRIAD HY-TRONIX INSTRUMENTS, INC. 301 WEST 5TH STREET NEWTON KS 671140827 AUTOMATIC TEST EQUIPMENT, NAMELY - CIRCUIT ANALYZERS;
SPEA SPEA S.P.A. Via Torino 16 I-10088 VOLPIANO (Torino) Italy AUTOMATIC TEST EQUIPMENT [ FOR TESTING ] FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF ELECTRONIC DEVICES AND CIRCUITS; AUTOMATIC TEST EQUIPMENT FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF SEMICONDUCTORS, CIRCUIT BOARDS AND ELECTRONIC PRODUCTS; FLYING PROBE TESTERS FOR TESTING OF SEMICONDUCTORS, ELECTRONIC CIRCUIT BOARDS AND COMPONENTS THEREOF; AUTOMATION COMPONENTS FOR AUTOMATIC TEST EQUIPMENT, NAMELY, INTELLIGENT MODULES INSTALLED IN AUTOMATIC HANDLING LINES FOR ELECTRONIC CIRCUIT BOARDS; TEST BENCH COMPONENTS FOR AUTOMATIC TEST EQUIPMENT, NAMELY, MODULAR TESTING UNITS FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF ELECTRONIC DEVICES AND CIRCUITS;In the statement, Column 1, lines 10 and 11, after equipment for testing should be deleted.;
SPEA SPEA-SISTEMI PER L'ELETTRONICA E L'AUTOMAZIONE S.P.A. VIA TORINO, 16 VOLPIANO (TORINO) 10088 Italy AUTOMATIC TEST EQUIPMENT [ FOR TESTING ] FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF ELECTRONIC DEVICES AND CIRCUITS; AUTOMATIC TEST EQUIPMENT FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF SEMICONDUCTORS, CIRCUIT BOARDS AND ELECTRONIC PRODUCTS; FLYING PROBE TESTERS FOR TESTING OF SEMICONDUCTORS, ELECTRONIC CIRCUIT BOARDS AND COMPONENTS THEREOF; AUTOMATION COMPONENTS FOR AUTOMATIC TEST EQUIPMENT, NAMELY, INTELLIGENT MODULES INSTALLED IN AUTOMATIC HANDLING LINES FOR ELECTRONIC CIRCUIT BOARDS; TEST BENCH COMPONENTS FOR AUTOMATIC TEST EQUIPMENT, NAMELY, MODULAR TESTING UNITS FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF ELECTRONIC DEVICES AND CIRCUITS;In the statement, Column 1, lines 10 and 11, after equipment for testing should be deleted.;
SPEA SPEA S.R.L. SISTEMI PER L'ELETTRONICA EL'AUTOMAZIONE Via Torino, 16 10088 VOLPIANO (TORINO) Italy AUTOMATIC TEST EQUIPMENT [ FOR TESTING ] FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF ELECTRONIC DEVICES AND CIRCUITS; AUTOMATIC TEST EQUIPMENT FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF SEMICONDUCTORS, CIRCUIT BOARDS AND ELECTRONIC PRODUCTS; FLYING PROBE TESTERS FOR TESTING OF SEMICONDUCTORS, ELECTRONIC CIRCUIT BOARDS AND COMPONENTS THEREOF; AUTOMATION COMPONENTS FOR AUTOMATIC TEST EQUIPMENT, NAMELY, INTELLIGENT MODULES INSTALLED IN AUTOMATIC HANDLING LINES FOR ELECTRONIC CIRCUIT BOARDS; TEST BENCH COMPONENTS FOR AUTOMATIC TEST EQUIPMENT, NAMELY, MODULAR TESTING UNITS FOR TESTING THE QUALITY, FUNCTION, PERFORMANCE CHARACTERISTICS, AND RELIABILITY OF ELECTRONIC DEVICES AND CIRCUITS;In the statement, Column 1, lines 10 and 11, after equipment for testing should be deleted.;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The invention relates to a design analysis technique for a test pattern analysis of chips via automatic test equipment (ATE) or a circuit simulation to detect potential design weakness or abnormal behavior in real customer application faults. Problems are solved by comprising a simulation procedure stored in an LRT database of automatic test equipment (ATE), defining test conditions and test patterns which execute and generate continuously for a time given by a user, applying the test stimuli and test conditions to a device under test (DUT) and starting the long running test (LRT), stopping the test automatically if any application faults occur and logging the failure time and timely test sequence and starting another test again until a given maximum number of tests are reached.