COMPUTER AIDED TEST EFFICIENCY ANALYSIS

Brand	Owner	Address	Description
STAMP	ARINC RESEARCH CORPORATION	2551 RIVA RD. ANNAPOLIS MD 21401	Computer-Aided Test Efficiency Analysis and Fault Diagnostic Services;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

The invention relates to a design analysis technique for a test pattern analysis of chips via automatic test equipment (ATE) or a circuit simulation to detect potential design weakness or abnormal behavior in real customer application faults. Problems are solved by comprising a simulation procedure stored in an LRT database of automatic test equipment (ATE), defining test conditions and test patterns which execute and generate continuously for a time given by a user, applying the test stimuli and test conditions to a device under test (DUT) and starting the long running test (LRT), stopping the test automatically if any application faults occur and logging the failure time and timely test sequence and starting another test again until a given maximum number of tests are reached.