COMPUTER PROGRAMS FOR SPECIMEN DEFECT

Brand	Owner	Address	Description
FAB MANAGER	INSYSTEMS, INC.	1120 RINGWOOD COURT SAN JOSE CA 95131	COMPUTER PROGRAMS FOR SPECIMEN DEFECT INSPECTION DATA ANALYSIS AND MANIPULATION;FAB;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A method for inspecting a specimen includes obtaining an image of a specimen through a first optical system, displaying the obtained image of the specimen on a display screen; dividing the displayed image of the specimen into plural regions and setting defect detection sensitivity for each of the plural divided regions, transferring the specimen from the first optical system to a second optical system, obtaining an image of the specimen through the second optical system, detecting defects on the specimen by processing the image obtained through the second optical system using the defect detection sensitivity set for a respective region, and displaying information of the detected defects on the display screen.