CUSTOM BUILT OFF SHELF TEST ENGINEERING

Brand	Owner	Address	Description
AVERNA	AVERNA TEST SYSTEMS INC.	5933 Brookshire Blvd Charlotte NC 28216	Custom-built and off-the-shelf test engineering software for use by product designers and manufacturers, allowing them to author, manage, measure, report, react to and improve products and manufacturing tests activities, assembly activities, quality control and communications; automated test equipment (ATEs) for use in manufacturing tests; all-in-one, high-throughput computer software and hardware to cover all testing and troubleshooting needs of repair centers and return merchandise authorization (RMA) processors;Test engineering services, namely, designing test systems used in the development and testing of complex real-time embedded systems, and measurement systems; professional services, namely, design of system architecture, software development, system engineering, project management, system validation and simulation;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

An integrated circuit device can be tested using a built-in test circuit, in the IC device, that tests the operation of an I/O cell. The built-in test circuit includes a pattern generator for generating a series of simulation signals. The built-in test circuit successively stores and retrieves the simulation signals from an I/O buffer of the I/O cell. For each iteration of storing and retrieving, test logic of the built-in test circuit compares the stored and retrieved data to check whether the data matches. If a mismatch is detected, the test logic issues a fail signal. The fail signal can cause a unique signal at the pad of the I/O cell that alerts a tester to the failure of the IC device. The fail signal can also cause the issuance of a device failure signal that can be detected at other pins of the IC device.