DIAGNOSTIC TEST EQUIPMENT USE

Brand	Owner (click to sort)	Address	Description
COCOS	Semiconductor Diagnostics, Inc.	3650 Spectrum Boulevard Ste. 130 Tampa FL 33612	DIAGNOSTIC TEST EQUIPMENT FOR USE IN SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION;
FAAST	SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.	Prielle Kornelia u. 2 Budapest H-1117 Hungary	DIAGNOSTIC TEST EQUIPMENT FOR USE IN SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION;FAST;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

The invention relates to a design analysis technique for a test pattern analysis of chips via automatic test equipment (ATE) or a circuit simulation to detect potential design weakness or abnormal behavior in real customer application faults. Problems are solved by comprising a simulation procedure stored in an LRT database of automatic test equipment (ATE), defining test conditions and test patterns which execute and generate continuously for a time given by a user, applying the test stimuli and test conditions to a device under test (DUT) and starting the long running test (LRT), stopping the test automatically if any application faults occur and logging the failure time and timely test sequence and starting another test again until a given maximum number of tests are reached.