ELECTRICAL METROLOGY DEVICES

Brand Owner Address Description
CNCV SEMICONDUCTOR PHYSICS LABORATORY CO., LTD. Prielle Kornelia u. 2 Budapest H-1117 Hungary Electrical metrology devices, namely, metrology devices used in manufacturing control and development of semiconductor devices and materials;CN CV;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method and an apparatus for organizing production data is provided. The method comprises performing at least one process run of semiconductor devices, and recording at least one manufacturing tag associated with the process run of semiconductor devices. The method further comprises performing metrology upon at least one process run of the semiconductor device for acquiring metrology data and for performing a metrology data stackification process upon the metrology data using the manufacturing tag for organizing and stacking the metrology data. The method further comprises modifying at least one control parameter is modified based upon the stacked metrology data.