ELECTRICAL TESTING EQUIPMENT NAMELY

Brand Owner (click to sort) Address Description
EIL E. I. L. Instruments, Inc. 10 Loveton Cir. Sparks MD 21152 Electrical Testing Equipment-Namely, Protective Relay Testing Units, Solid State Trip Device Testing Units, High Current Testing Units for Circuit Breakers, Motor Overload Testing Units, Frequency Testing Units, and Recloser Testing Units;
METSERCO Chromalloy American Corporation Saint Louis MO ELECTRICAL TESTING EQUIPMENT-NAMELY, A.C. AND D.C. METERS FOR TESTING AND CHECKING ELECTRICAL METERS, ELECTRICAL DEVICES, AND THE LIKE, ELECTRICAL TACHOMETERS, PYROMETERS, ORIFICE METERS, ORIFICE WELL TESTERS, CHART DRIVES AND RECORDERS, PRESSURE ELEMENTS-NAMELY, TUBING, DIAPHRAGMS, BELLOWS, BOURDON TUBES, AND THE LIKE, THERMOWELLS, HELICAL BOURDON TUBES, LEVELLING SADDLES, AND COMPONENTS FOR THE FOREGOING;MAGNETOS;SERVICE AND REPAIR OF ELECTRICAL TACHOMETERS, PYROMETERS, MOTOR-DRIVEN CHEMICAL INJECTORS AND PUMPS, MAGNETOS AND ELECTRICAL TESTING EQUIPMENT, ORIFICE METERS, ORIFICE WELL TESTERS, CHART DRIVE AND RECORDERS, PRESSURE ELEMENTS, THERMOWELLS, BOURDON TUBES, LEVELLING SADDLES, AND COMPONENTS FOR THE FOREGOING;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consisting of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between the wafer and electrical testing equipment. A rigid substrate has conductors thereon which establish electrical contact with the wafer. The test fixture need not be opened until the burn-in and electrical testing are completed. After burn-in stress and electrical testing, it is possible to establish interconnection between the single die or separate and package dice into discrete parts, arrays or clusters, either as singulated parts or as arrays.