ELECTRON

Brand	Owner (click to sort)	Address	Description
9 ATOMIC9	Entuit	28563 Linda Vista Street Canyon Country CA 91387	The mark consists of the characters Atomic9. The stylized graphic layout is described as using a futuristic font. A representative picture is also part of the trademark which consists of a tilted 9 with a graphical representation of an orbit around the 9 with a sphere on the orbit representing an electron.;NINE ATOMIC NINE;Color is not claimed as a feature of the mark.;Retail store and on-line retail store services featuring consumer electronics and household appliances; Wholesale distributorships featuring consumer electronics and household appliances;
ELEKTRON	LUXFER GROUP LIMITED	Lumns Lane Manchester M278LN	ELECTRON;Castings, Extrusions, Rolled Sheet [ and Forgings ] of Magnesium Base Alloys Containing Zirconium, Thorium, Zinc, Rare Earth, and/or Other Metals;
ELEKTRON	MAGONESUIM ELEKTRON, LTD.		ELECTRON;Castings, Extrusions, Rolled Sheet [ and Forgings ] of Magnesium Base Alloys Containing Zirconium, Thorium, Zinc, Rare Earth, and/or Other Metals;
ELEKTRON	Ariel Ltd	Ariel Works, Yeovil Road Yeovil Road Crewkerne TA187NR United Kingdom	ELECTRON;(Based on Use in Commerce) Motor cars(Based on 44(e)) Motor cars;
LEKTRON	ROVCAL, INC.	3001 Deming Way Middleton WI 53562	ELECTRON;ELECTRIC SHAVER AND BLADES THEREFOR;
LEKTRON	LEKTRON CORPORATION, THE	525 WEST 45TH ST. NEW YORK NY	ELECTRON;ELECTRIC SHAVER AND BLADES THEREFOR;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

Provided is an electron beam system, in which an electron beam emitted from an electron gun is irradiated to a stencil mask, and the electron beam that has passed through the stencil mask is magnified by an electron lens and then detected by a detector having a plurality of pixels so as to form an image of the sample. Further provided is an electron beam system, in which a primary electron beam emitted from an electron gun is directed to a sample surface of a sample prepared as a subject to be inspected, and an electron image formed by a secondary electron beam emanated from the sample is magnified and detected, wherein an NA aperture is disposed in a path common to both of the primary electron beam and the secondary electron beam. An electron lens is disposed in the vicinity of a sample surface, and in this arrangement, a crossover produced by the electron gun, the electron lens and the NA aperture may be in conjugate relationships relative to each other with respect to the primary electron beam.