ELECTRONIC TEST EQUIPMENT MEASURING

Brand Owner (click to sort) Address Description
MANTA TEST SYSTEMS MANTA TEST SYSTEMS 2213 Dunwin Drive Mississauga, Ontario L5L 1X2 Canada electronic test equipment for measuring the performance of power system protection, control and metering devices used in the electrical power and utility industry;TEST SYSTEMS;
MANTA TEST SYSTEMS Doble Engineering Company 123 Felton Street Marlborough MA 01752 Electronic test equipment for measuring the performance of power system protection, control and metering devices used in the electrical power and utility industry;Color is not claimed as a feature of the mark.;TEST SYSTEMS;
MANTA TEST SYSTEMS MANTA TEST SYSTEMS LTD. 4060 B SLADEVIEW, CRESCENT #1 MISSISSAUGA, ONTARIO L5L 5Y5 Canada Electronic test equipment for measuring the performance of power system protection, control and metering devices used in the electrical power and utility industry;Color is not claimed as a feature of the mark.;TEST SYSTEMS;
XCEL 3M Company 3M Center, 2501 Hudson Road St. Paul MN 55144 Electronic test equipment for measuring and analyzing amount of Adenosine triphosphate (ATP) in test samples by way of bioluminescence to provide an indication of cellular contamination in the test sample;
 

Where the owner name is not linked, that owner no longer owns the brand

   
Technical Examples
  1. A semiconductor test equipment and a timing measuring method for use in the semiconductor test equipment are provided, that can perform simultaneous measurement of timings of defined times between edges in cycles even in a case where a capacity is large as in a test pattern for the semiconductor test equipment or a case where the cycles are away from each other. In order to achieve this, the semiconductor test equipment includes: a data shifting flip-flip for shifting input data with a reference clock of the semiconductor test equipment by a period of one clock, provided in a secondary logical comparison circuit 71; the first logical comparison and selection circuit 71a for determining whether timings of the first defined time Ta that is a period between two pre-selected edges are good or not, and outputting a determination result; and the second logical comparison and selection circuit 71b for determining whether timings of the second defined time Tb that is a period between two pre-selected edges are good or not, and outputting a determination result.