ELECTRONIC TEST UNIT FOR USE

Brand	Owner	Address	Description
CHECKMATE	HERAEUS ELECTRO-NITE INTERNATIONAL N.V.	Centrum Zuid 1105 Houthalen 3530 Belgium	ELECTRONIC TEST UNIT FOR USE IN MONITORING THE OPERATION OF SENSOR SYSTEMS;CHECK MATE;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A test arrangement for testing the interconnections of an electronic circuit (100) and a further electronic circuit is provided. A first selection of I/O nodes (120), which are arranged to receive input data in a functional mode of the electronic circuit (100), and which are coupled to a test unit in a test mode of the electronic circuit (100). The test unit has a combinatorial circuit (160) for implementing a multiple-input XOR or XNOR gate. The test unit also provides interconnections between the first selection of I/O nodes (120) and a second selection of I/O nodes (130) via logic gates (141-144). These interconnections increase the interconnect test coverage of the electronic device (100), because the interconnects with the further electronic circuits that are associated with I/O nodes (131-134) become testable as well.