ELECTRONIC TESTING APPARATUSES SEMICONDUCTOR

Brand Owner Address Description
AZTC NHK SPRING CO., LTD 10, Fukuura 3-chome, Kanazawa-ku, Yokohama-shi, Kanagawa 236-0004 Japan Electronic testing apparatuses for semiconductor devices, namely, test pins for testing printed circuit boards and replacement parts thereof; Electronic testing apparatuses for circuit boards, namely, test adapters for testing printed circuit boards and replacement parts thereof; Electronic testing apparatuses for semiconductor integrated circuit devices, namely, probes for testing integrated circuits; Electronic testing sockets for semiconductor devices, namely, test adaptors for testing printed circuit boards; Electronic testing probes for semiconductor integrated circuit chips, Electronic testing probes for printed circuit boards; Electronic testing probes for TAB chips, namely, chips mounted on film wired with copper foil, namely, probes for testing integrated circuits; Electronic testing probes for COF chips, namely, chips mounted on copper-plated film, namely, probes for testing integrated circuits; Electronic testing probes for semiconductor devices, namely, test adaptors for testing printed circuit boards;AZTEC;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Apparatuses and methods for testing electronic components, such as printed circuit boards, in an ergonomic manner are disclosed. An electronic component testing apparatus comprises a base, a test chamber rotatably mounted to the base, and a heating and cooling unit coupled to the test chamber. The test chamber further includes a chassis defining an enclosure having an opening and at least one test slot accessible through the opening for facilitating operative coupling of an electronic component to the test chamber for testing of the electronic component.