ELECTRONIC TRIP UNIT FOR CIRCUIT

Brand Owner (click to sort) Address Description
DIGIPACT Merlin Gerin S.A. rue Henri Tarze Grenoble 3800 France ELECTRONIC TRIP UNIT FOR CIRCUIT BREAKERS, CIRCUIT INTERRUPTER WITH DIGITAL TRIP UNIT, OVERCURRENT PROTECTION APPARATUS, CIRCUIT BREAKERS AND SWITCHES, AND PARTS AND FITTINGS FOR ALL THESE GOODS;
MASTERPACT SCHNEIDER ELECTRIC INDUSTRIES SAS 35 rue Joseph Monier RUEIL MALMAISON 92500 France ELECTRONIC TRIP UNIT FOR CIRCUIT BREAKERS, CIRCUIT INTERRUPTER WITH DIGITAL TRIP UNIT, OVERCURRENT PROTECTION APPARATUS, CIRCUIT BREAKERS AND SWITCHES, AND PARTS AND FITTINGS FOR ALL THESE GOODS;MASTER PACK;
 

Where the owner name is not linked, that owner no longer owns the brand

   
Technical Examples
  1. A test arrangement for testing the interconnections of an electronic circuit (100) and a further electronic circuit is provided. A first selection of I/O nodes (120), which are arranged to receive input data in a functional mode of the electronic circuit (100), and which are coupled to a test unit in a test mode of the electronic circuit (100). The test unit has a combinatorial circuit (160) for implementing a multiple-input XOR or XNOR gate. The test unit also provides interconnections between the first selection of I/O nodes (120) and a second selection of I/O nodes (130) via logic gates (141-144). These interconnections increase the interconnect test coverage of the electronic device (100), because the interconnects with the further electronic circuits that are associated with I/O nodes (131-134) become testable as well.