ELECTRONIC IMAGING PLATFORMS

Brand Owner (click to sort) Address Description
EXPLORE ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; computer hardware and software for inspection of semiconductor materials, namely, semiconductor wafers and reticles;
EXPLORE HERMES MICROVISION INCORPORATED B.V. DE RUN 6501 5504 DR VELDHOVEN Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; computer hardware and software for inspection of semiconductor materials, namely, semiconductor wafers and reticles;
HERMES MICROVISION ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; computer hardware and software for inspection of semiconductor materials, namely, semiconductor wafers and reticles;
LIGHTNING SCAN ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; computer hardware and software for inspection of semiconductor materials, namely, semiconductor wafers and reticles;
MICROVISION ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; computer hardware and software for inspection of semiconductor materials, namely, semiconductor wafers and reticles;MICRO VISION;
MIRELIS Hitachi High-Tech Corporation 17-1, Toranomon 1-chome, Minato-ku Tokyo 105-6409 Japan Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; downloadable image processing software for electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles and operating system software for electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles;
MULTIBEAM ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles;MULTI BEAM;
MULTISCAN ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles;MULTI SCAN;
PARABEAM ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles;PROBLEM;
PARASCAN ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles;PARA SCAN;
STEP&IMAGE Negevtech, Ltd. 12 Hamada Street Rehovot 76703 Israel electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers, reticles and photomasks;STEP AND IMAGE;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Methods, apparatus, and systems for updating firmware for clustered computing platforms. Firmware provided on each platform is loaded for operating system runtime availability. The firmware update process begins by issuing an update directive that includes firmware update data to a first platform. That platform then interacts with firmware running on other platforms to update the firmware for those platforms, wherein communications between the platforms is enabled via an out-of-band (OOB) communication channel or network. In one embodiment, OOB communications are facilitated by a hidden execution mode known as the System Management Mode (SMM), which has the ability to receive and respond to periodic System Management Interrupts (SMI) and execute corresponding SMI handlers configured to support inter-platform communication in a manner that is transparent to operating systems running on the platforms. The method allows firmware to be updated across multiple platforms, such as server blades, using a single administrative action.