ELECTRONIC INSPECTION DEVICE COMPRISED

Brand	Owner	Address	Description
THRUSPECT	ICO, INC.	11490 Westheimer Houston TX 77077	electronic inspection device comprised of circumferentially spaced sensors and an electronic processor for detecting defects in coiled tubing;THRU INSPECTION;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

Wafer inspection systems and methods are provided. One inspection system includes a module measurement cell coupled to a host inspection system by a wafer handler. The module measurement cell is configured to inspect a wafer using one or more modes prior to inspection of the wafer by the host inspection system. The one or more modes include backside inspection, edge inspection, frontside macro defect inspection, or a combination thereof. Another inspection system includes two or more low resolution electronic sensors arranged at multiple viewing angles. The sensors are configured to detect light returned from a wafer substantially simultaneously. A method for analyzing inspection data includes selecting a template corresponding to a support device that contacts a backside of a wafer prior to inspection of the backside of the wafer. The method also includes subtracting data representing the template from inspection data generated by inspection of the backside of the wafer.