ELECTRONIC TEST

Brand Owner (click to sort) Address Description
CERTIPRIME KEYSIGHT TECHNOLOGIES, INC. 1400 Fountaingrove Pkwy Santa Rosa CA 95403 Electronic test, signaling and measurement systems and equipment, namely, oscillators; signal generators and analyzers, logic-signal sources, pulse and data generators, function and arbitrary waveform generators; sweeper generators and sweeper oscillators for testing and measuring electrical and electronic equipment; spectrum analyzers, logic analyzers, waveform analyzers and oscilloscopes; network and spectrum analyzers; modulation-domain and time-interval analyzers; multimeters; power, voltage, current, impedance, inductance, capacitance, and resistance meters; electronic frequency counters, equipment to test communication equipment testers, namely, wire based and wireless based communications equipment testers; telephone, cellular telephone, television, cable television and broadband equipment testers; light wave testers; computer and communications network testers;cell-site radio frequency (RF) testers;Refurbishment of scientific, electronic, test, signaling, measurement, optical, and telecommunication equipment;CERTIFIED PRIME;
LEKTROX Lektrox Company, The 10301 Bellwood Avenue New Port Richey FL 34654 electronic test, measurement and control apparatus, namely sensors, analyzers and classifiers for detecting and monitoring comminution process conditions;
LXI AGILENT TECHNOLOGIES, INC. 5301 Stevens Creek Boulevard Santa Clara CA 95051 Electronic test, signaling and measurement systems, equipment and parts therefor; chemical and biological analytical systems and equipment, and parts therefor; optical equipment and components; communication equipment and components; semiconductors; electronic components; computer hardware and peripherals and parts therefor; computer software;
LXI LXI Consortium, Inc. 361 Second Avenue c/o Bode Enterprises, LLC, Suite 203 Niwot CO 805441016 Electronic test, signaling and measurement systems and equipment, namely, oscillators; signal generators and analyzers, logic-signal sources, pulse and data generators, function and arbitrary waveform generators; sweepers, namely, sweeper generators for testing and measuring electronic equipment by means of signal frequency sweep generators and signal sweeping frequency synthesizers that sweep from one frequency to another; spectrum analyzers, logic analyzers, waveform analyzers and oscilloscopes; network and spectrum analyzers; modulation-domain and time-interval analyzers; hand held testing meters, namely, wireless communication testers, telephone, cellular telephone, television, cable television and broadband equipment testers, light wave testers, computer and communications network testers, power supply testers, [ interferometers, vibration transducers, probes for remote electronic test, ] signalling and measurement, cell-site radio frequency (RF) testers; signalling and measurement testers, DC electronic loads, [ lasers for test and measurement purposes; chemical and biological analytical equipment, namely, chromatographs, chromatography columns, mass spectrometers; ionization sources for mass spectrometers, spectrophotometers; DNA and protein sequencers; capillary electrophoresis systems and gene analysis equipment, namely, DNA and protein sequencers; electrical, computer and chemical hardware and software for the analysis of DNA, RNA, cells and proteins, DNA microarrays, DNA microarray scanners, DNA hybridization chambers; ] multimeters; power, voltage, current, impedance, inductance, capacitance, and resistance meters; electronic frequency counters; DC voltage and current generators for electronic device testing and measurement; automatic test equipment for integrated circuits, circuit boards and electronic equipment, namely, system on a chip (SOC) testers, memory testers, parametric testers, and in-circuit testers, wire and cables testers; equipment, namely, volt meters, amp meters, resistance meters, impedance meters, network analyzers, and TDR testers for fault location to perform parametric and functional tests used to test wires and cables; wireless communication testers and telephone, cellular telephone, television, cable television and broadband equipment testers used to test communication equipment; [ light wave test equipment, namely, light wave analyzers for use in measuring the proper wavelength, appearance, and reflected colors of objects; ] computer and communications network testers; [ software for monitoring telephone and network traffic for use in the fields of aerospace, defense, automotive, industrial, medical, and consumer electronics; bar code readers; ] power supplies;[ interferometers, vibration transducers; ] data acquisition and control systems comprised of analog and digital signal I/O circuits connected to computers or microcontroller systems or communications networks; [ remote monitoring probes for use in performing electronic test, signalling and measurement functions; high-frequency computer-aided engineering software for use in the design, development, manufacture, and operation of electronics equipment and communications networks; ] cell-site RF testers; [ laser-based positioning systems comprised of integrated circuits, computer hardware, and computer software for analyzing, displaying, and storing data; microprocessor development systems, comprised of computer hardware, firmware, and operating systems for use in designing microcontroller-based electronics;] DC electronic loads; [ lasers for test and measurement purposes;] clocks for scientific, laboratory or industrial applications and for use as specialized recording apparatuses, namely, clocks for scientific, laboratory or industrial applications and for use as specialized recording apparatuses, namely, chronometers and central processing clocks; metallic cable testers, [ subscriber loop testers, ] digital multimeters, source meters, electrometers, digital multimeters and switch cards; signal dividers, amplifiers, voltage supplies, relays, and measuring instruments, namely, ammeters, voltmeters, ohmmeters, electrometers, static meters, and electrical bridges; electronic measurement and test instruments for testing the performance, features, compatibility, interoperability, functionality, compliance and adherence to industry standards in the fields of computers, electronics, and telecommunications; [ chemical and biological analytical systems and equipment sold as a unit consisting of chromatographs, chromatography columns, septa, seals and syringes; mass spectrometers; ionization apparatus, namely, ion source controls, control software, ion source enclosure apparatus, and associated hardware, all for use in mass spectrometry; spectrophotometers; DNA and protein sequencers; capillary electrophoresis systems and gene analysis equipment, namely, DNA and protein sequencers; electrical, computer, and chemical hardware and software for the analysis of DNA, RNA, cells and proteins, DNA microarrays, DNA microarray scanners, and DNA hybridization chambers, electronic and optical equipment and components, namely, integrated circuits, semiconductors, application-specific integrated circuits (ASIC's) and radio frequency integrated circuits (RFIC's); electrical components, namely, amplifiers, assemblies, attenuators, chipsets, diodes, duplexers, filters, mixers, modulators, modules, protocol IC's, receivers, switches, transceivers, transistors, transmitters, emitters, detectors and transceiver modules for voice, data and video, wireless, wireline and broadband communications applications, computer data transfer, mass storage, infrared applications and for radio-frequency (RF), microwave, motor control, fiber optic, and imaging applications;] data communication testers; [ measuring instruments, namely, printed wiring boards and printed circuit boards; ] [ image sensors ] [ ; optical position sensors; optical mouse sensors; light emitting diodes and dot matrix displays; and application specific integrated circuits (ASIC's); solid state lasers and lasers not for medical use; fiber-optics for voice, data and video; fiber-optic-links and high-speed I/O products, namely, fiber optic cables, fiber optic light and image conduits, and digital input and output scanners for computer data transfer and mass storage; optical encoders, optical couplers; motion control sensors for instruments, industrial equipment, office equipment and printers; optically isolated components, namely, optical scanners, readers, and cables for use in the fields of industrial equipment and motor control; computer hardware; computer software for use in testing, signaling and measuring electronic, chemical or biological analytical, optical, telecommunication, semiconductor, network management, network security, engineering, and data acquisition equipment for use in the fields of aerospace, defense, automotive, industrial, medical, and consumer electronics; computer software that performs tests and measurements of acquisition, control, analysis, and display of analog and digital data and for use in the fields of scientific and engineering data acquisition, analysis, monitoring, and emulating scientific and engineering instruments; computer software for testing the performance, features, compatibility, interoperability, functionality, compliance and adherence to industry standards of computers, electronics, and telecommunications products; downloadable electronic publications in the nature of books, periodicals, pamphlets, brochures, bulletins, magazines, product manuals, white papers, data sheets, newsletters, educational and teaching materials, and guides all in the fields of science, technology, computer hardware and software, electronic and optical components and equipment, testing, measurement, chemical or biological analysis, telecommunications, and medicine ];
 

Where the owner name is not linked, that owner no longer owns the brand

   
Technical Examples
  1. A test arrangement for testing the interconnections of an electronic circuit (100) and a further electronic circuit is provided. A first selection of I/O nodes (120), which are arranged to receive input data in a functional mode of the electronic circuit (100), and which are coupled to a test unit in a test mode of the electronic circuit (100). The test unit has a combinatorial circuit (160) for implementing a multiple-input XOR or XNOR gate. The test unit also provides interconnections between the first selection of I/O nodes (120) and a second selection of I/O nodes (130) via logic gates (141-144). These interconnections increase the interconnect test coverage of the electronic device (100), because the interconnects with the further electronic circuits that are associated with I/O nodes (131-134) become testable as well.