HIGH FREQUENCY WAFER PROBING APPARATUS

Brand Owner Address Description
CASCADE MICROTECH CASCADE MICROTECH, INC. 2430 N.W. 206th Avenue Beaverton OR 97006 HIGH FREQUENCY WAFER PROBING APPARATUS FOR MEASURING ON-WAFER CIRCUITS AND COMPONENTS;CASCADE MICRO-TECH;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.