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Technical Examples
There is provided a semiconductor device in which the thresholds of gate electrodes in transistors can be adjusted together for each of regions having their own functions different from one another. The semiconductor device is provided with: a P-type Si substrate 109; a P-type annular well 181 provided in the element formation surface side of the P-type Si substrate 109; and a N-type annular well 183 provided inside the P-type annular well 181. Moreover, an SRAM-P-type well 185 and an SRAM-N-type well 189 are provided inside the N-type annular well 183. A deep N-type well 133 is provided nearer to the bottom side of the P-type Si substrate 109 than the SRAM-P-type well 185 and the SRAM-N-type well 189. A plurality of P-type wells 103 are provided outside the P-type annular well 181, and a N-type 101 is provided in such a way that the well 101 encloses the outside faces of the P-type wells 103.