INTEGRATED CIRCUIT CORES USE

Brand Owner (click to sort) Address Description
FAST14 INTRINSITY, INC. 11612 RM 2244 Bldg 2 Ste 200 Austin TX 78738 Integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers; downloadable electronic publications, namely, manuals, data sheets, guides, brochures, specifications and literature featuring product information; computer software for the design of semiconductors, semiconductor devices, semiconductor chips, integrated circuits, integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers;FAST FOURTEEN;Engineering services for the design of semiconductors, semiconductor devices, semiconductor chips, integrated circuits, integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers;
INTRINSITY APPLE INC. One Apple Park Way Cupertino CA 95014 Integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers; downloadable electronic publications, namely, manuals, data sheets, guides, brochures, specifications and literature featuring product information; computer software for the design of semiconductors, semiconductor devices, semiconductor chips, integrated circuits, integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers;Engineering services for the design of semiconductors, semiconductor devices, semiconductor chips, integrated circuits, integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers;
NDL APPLE INC. One Apple Park Way Cupertino CA 95014 Integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers; downloadable electronic publications, namely, manuals, data sheets, guides, brochures, specifications and literature featuring product information; computer software for the design of semiconductors, semiconductor devices, semiconductor chips, integrated circuits, integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers;Engineering services for the design of semiconductors, semiconductor devices, semiconductor chips, integrated circuits, integrated circuit cores for use in semiconductors, intellectual property cores for use in semiconductors, macro cells, microprocessors, and microcontrollers;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method and apparatus for inserting design-for-debug (DFD) circuitries in an integrated circuit to debug or diagnose DFT modules, including scan cores, memory BIST (built-in self-test) cores, logic BIST cores, and functional cores. The invention further comprises using a DFD controller for executing a plurality of DFD commands to debug or diagnosis the DFT modules embedded with the DFD circuitries. When used alone or combined together, these DFD commands will detect or locate physical failures in the DFT modules in the integrated circuit on an evaluation board or system using a low-cost DFT debugger. A computer-aided design (CAD) method is further developed to synthesize the DFD controller and DFD circuitries according to the IEEE 1149.1 Boundary-scan Std. The DFD controller supports, but is not limited to, the following DFD commands: RUN_SCAN, RUN_MBIST, RUN_LBIST, DBG_SCAN, DBG_MBIST, DBG_LBIST, DBG_FUNCTION, SELECT, SHIFT, SHIFT_CHAIN, CAPTURE, RESET, BREAK, RUN, STEP, and STOP.