MANUFACTURE OTHERS FACILITIES

Brand Owner (click to sort) Address Description
RESULTS ORIENTED FACILITY STRATEGY JOHNSON CONTROLS, INC. 5757 N. GREEN BAY AVENUE, MILWAUKEE WI 53209 manufacture for others of facilities management controls systems; namely, heating, ventilating, air conditioning, refrigeration, energy, lighting, electrical, fire alarm, and security access systems for industrial, commercial, and governmental facilities;installation, maintenance, and repair of facilities management controls systems; namely, heating, ventilating, air conditioning, refrigeration, energy, lighting, electrical, fire alarm, and security access systems for industrial, commercial, and governmental facilities;FACILITY;design for others of facilities management controls systems; namely, heating, ventilating, air conditioning, refrigeration, energy, lighting, electrical, fire alarm, and security access systems for industrial, commercial, and governmental facilities;
RESULTS ORIENTED SERVICES JOHNSON CONTROLS, INC. 5757 N. GREEN BAY AVENUE, MILWAUKEE WI 53209 manufacture for others of facilities management controls systems; namely, heating, ventilating, air conditioning, refrigeration, energy, lighting, electrical, fire alarm, and security access systems for industrial, commercial, and governmental facilities;installation, maintenance, and repair of facilities management controls systems; namely, heating, ventilating, air conditioning, refrigeration, energy, lighting, electrical, fire alarm, and security access systems for industrial, commercial, and governmental facilities;SERVICES;design for others of facilities management controls systems; namely, heating, ventilating, air conditioning, refrigeration, energy, lighting, electrical, fire alarm, and security access systems for industrial, commercial, and governmental facilities;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. In a system including a plurality of diverse semiconductor manufacturing facilities, each of the facilities having a respective manufacturing process requiring semiconductor specific design information in a corresponding diverse format, a method for supplying data to each of the facilities in an appropriate format includes establishing a database for each of the plurality of facilities, the database identifying the appropriate format for each of the facilities. The method also includes receiving semiconductor specific design information and converting the design information in accordance with the appropriate format for one of selected ones of the facilities. The method further includes providing a respective tapeout to said one of the selected ones of the facilities, each tapeout comprising the design information formatted in the appropriate format for the respective facility receiving the tapeout.