MARK COMPRISES AIQ

Brand Owner Address Description
AIQ TRACK DATA CORPORATION 95 Rockwell Place Brooklyn NY 11217 THE MARK COMPRISES AIQ AND A FANCIFUL DESIGN.;COMPUTER PROGRAMS AND INSTRUCTION MANUALS FOR USE THEREWITH SOLD AS A UNIT FOR USE BY INVESTORS, BROKERS AND OTHER INVESTMENT PROFESSIONALS;IN THE STATEMENT, COLUMN 1, LINE 5, 89450 IS DELETED, AND 89452 IS INSERTED. IN THE STATEMENT, COLUMN 2, LINES 1 THROUGH 3 ARE DELETED, AND THE DRAWING IS AMENDED TO APPEAR AS FOLLOWS: PUBLISH NEW CUT;THE LINING FEATURES IN THE DESIGN PORTION OF THE MARK ARE INHERENT ELEMENTS AND ARE NOT INTENDED TO INDICATE COLOR.;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The present invention provides an overlay mark for aligning different layers on a semiconductor wafer. The overlay mark comprises a bar-in-bar mark and two bar sets on the semiconductor wafer. The bar-in-bar mark comprises an inner bar mark positioned in one of the pre-layer and an outer bar mark positioned in the other pre-layer. The two bar sets are perpendicular to each other, and each of two bar sets comprises two parallel bars. The bars can be connected and the lengths of the bars can be the same or different.