MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE

Brand Owner (click to sort) Address Description
TESLA LOGOS Core Wafer Systems, Inc. 212 15TH AVE NE WASECA MN 56093 MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;
TESLA NEWTON Core Wafer Systems, Inc. 212 15TH AVE NE WASECA MN 56093 MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;
TESLA PDR Core Wafer Systems, Inc. 212 15TH AVE NE WASECA MN 56093 MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;
TESLA PPR Core Wafer Systems, Inc. 212 15TH AVE NE WASECA MN 56093 MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;TESLA PARALLEL PARAMETRIC RELIABILITY;
TESLA SDR Core Wafer Systems, Inc. 212 15TH AVE NE WASECA MN 56093 MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;
TESLA SPR Core Wafer Systems, Inc. 212 15TH AVE NE WASECA MN 56093 MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;
TESLA SUITE Core Wafer Systems, Inc. 212 15TH AVE NE WASECA MN 56093 MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;
TESLA VRA Core Wafer Systems, Inc. 212 15TH AVE NE WASECA MN 56093 MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A system and method for online configuration of a measurement device for a measurement system. The user accesses a server with a client computer over a network and specifies a desired measurement task. If the user lacks the hardware required to perform the task, hardware specifications and configuration software and/or data specific to the user's application, i.e., to perform the task, are sent to a manufacturer, who pre-configures the hardware with the configuration software and/or data to perform the task and sends the pre-configured hardware to the user. The hardware may be re-configurable hardware, such as a programmable hardware element or processor/memory based device. Configuration software and/or data for configuring the user's measurement system hardware (and/or software) to perform the desired task may also be sent to the user. The configuration software sent to the user may comprise a graphical program usable by the measurement system to perform the task.