OPTICAL MEASURING APPARATUS INSTRUMENTS

Brand Owner (click to sort) Address Description
APPLISKAN THERMO FISHER SCIENTIFIC OY Ratastie 2 Vantaa Fl-01620 Finland Optical measuring apparatus and instruments for laboratory use, namely, photometers, fluorometers and spectrofluorometers and recorded computer programs related to the aforementioned goods, namely, computer programs for operating the aforementioned goods and computer programs for processing data and measurements from the aforementioned goods;79024224;In the statement, after line 11, Priority claimed 44(d) Finland Application T200502359, Filing dated 09-14-2005. should be inserted.;
ATTOSCAN OLYMPUS CORPORATION 2951 Ishikawa-machi, Hachioji-shi, Tokyo 192-8507 Japan Optical measuring apparatus and instruments for research and clinical use for measuring biomolecule;ATTO SCAN;
BINDIT THERMO FISHER SCIENTIFIC OY Ratastie 2 Vantaa Fl-01620 Finland Optical measuring apparatus and instruments for laboratory use, namely, photometers, fluorometers and spectrofluorometers; and recorded computer programs related to the aforementioned goods;BIND IT;
FILLIT THERMO FISHER SCIENTIFIC OY Ratastie 2 Vantaa Fl-01620 Finland Optical measuring apparatus and instruments for laboratory use, namely, photometers, fluorometers and spectrofluorometers; and recorded computer programs related to the aforementioned goods;FILL IT;
HOHNER Hohner Corp. 777 Cayuga Street Lewiston NY 14092 optical measuring apparatus and instruments;
HOHNER Bloechle, Walter 5536 Regional Road #81 Beamsville, Ontario L0R 1B3 Canada optical measuring apparatus and instruments;
YIELDSTAR ASML NETHERLANDS B.V. De Run 6501 DR Veldhoven NL-5504 Netherlands Optical measuring apparatus and instruments for measuring test wafers for the manufacture of electronic circuits and semiconductor chips in order to assess the lithographical exposure quality thereof;YIELD STAR;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. This invention is intended to reduce the cost by displaying the load information of a plurality of circuits with a single display device and transferring one of the two communication units in the measuring instruments from the measuring instruments to the display device to acquire the load information of a plurality of circuits. The display device and the measuring instruments are separated from each other, and the display device includes a plurality of communications units connectable with a plurality of devices, while each of many measuring instruments includes a single communication unit.