PARTICLE EMISSION MONITORS

Brand Owner (click to sort) Address Description
DYNATRACK PCME Limited St. Ives Clearview Building Edison Road Cambridgeshire PE273GH United Kingdom PARTICLE EMISSION MONITORS, PARTICLE FLOW MONITORS, AND DUST EMISSION MONITORS ALL FOR USE IN THE MONITORING PROCESSES CARRIED OUT IN INDUSTRIAL PLANTS;DINE A TRACK;
E.C.O.S. TI3, Inc. 701 E. Piano Parkway, Suite 506 Plano TX 75074 particle emission monitors, particle flow monitors, and dust emission monitors all for use in the monitoring processes carried out in industrial plants;
ELECTRODYNAMIC PCME, Inc. 253 West Joe Orr Road Chicago Heights IL 60411 particle emission monitors, particle flow monitors and dust emission monitors, all for use in monitoring processes carried out in industrial plants; and parts and fittings therefor;ELECTRO-DYNAMIC;
ELECTRODYNAMIC ENVEA UK LTD Envea House, Rose & Crown Road Swavesey, Cambridge CB United Kingdom particle emission monitors, particle flow monitors and dust emission monitors, all for use in monitoring processes carried out in industrial plants and parts and fittings therefor;
ELECTRODYNAMIC PCME Ltd Clearview Building Edison Road St Ives Cambridgeshire PE273GH United Kingdom particle emission monitors, particle flow monitors and dust emission monitors, all for use in monitoring processes carried out in industrial plants and parts and fittings therefor;
PCME PCME Limited St. Ives Clearview Building Edison Road Cambridgeshire PE273GH United Kingdom particle emission monitors, particle flow monitors and dust emission monitors, all for use in monitoring processes carried out in industrial plants; and parts and fittings therefor;PCME;
TRIBOACE PCME Ltd. Stonehill Stukeley Meadows Industrial Estate Huntingdon, Cambridgeshire PE18 6EL particle emission monitors, particle flow monitors and dust emission monitors, all for use in monitoring processes carried out in industrial plants; and parts and fittings therefor;
VELECTRO ENVEA UK LTD Envea House, Rose & Crown Road Swavesey, Cambridge CB United Kingdom Particle emission monitors, particle flow monitors, stack gas and air flow monitors, dust emission monitors, all for use in monitoring processes carried out in industrial plants; parts and fittings for all the aforesaid goods being sensor devices consisting of electronics enclosures, mechanics and sensor rods; downloadable and recorded computer software for controlling apparatus for monitoring particle emissions, particle flow, stack gas and airflow, and dust emissions;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An IC device is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined, substantially constant emission rate. The emission rate may be tunable. In one aspect, a radioactive adhesive composition is provided for bonding a semiconductor device to a chip carrier. The radioactive adhesive composition is made from a cured reaction product including a resin and a filler, and may be reworkable or non-reworkable. Either the resin or the filler, individually or both together as a mix, are doped substantially uniformly with the transient-particle-emitting material, thereby putting the transient-particle-emitting in close proximity with the IC to be tested. The underfill is formulated to have a stable chemistry, and the doped particles are encapsulated, so as to contain the emissions. Accelerated transient-particle-emission testing may then be performed on the IC in situ to provide accelerated detection of soft errors.