PROBES ON WAFER TESTING

Brand Owner (click to sort) Address Description
EYE-PASS CASCADE MICROTECH, INC. 2430 N.W. 206th Avenue Beaverton OR 97006 probes for on-wafer testing of integrated circuits;eye pass;
INFINITY PROBE FORMFACTOR BEAVERTON, INC. 9100 SW GEMINI DRIVE BEAVERTON OR 97008 Probes for on-wafer testing of integrated circuits;PROBE;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Apparatuses and methods for cleaning test probes used in a semiconductor testing machine of the type having a plurality of test probes configured to contact the surface of a semiconductor wafer to test one or more dies formed thereon. In one embodiment, the apparatus includes a roller-support arm and a cylindrical roller supported by the roller-support arm. The roller has an outer surface comprising a sticky material. Debris on the probes will adhere to the sticky material as roller is rolled across tips of the probes. The probes are thereby cleaned.