PROBES SCIENTIFIC PURPOSES
| Brand | Owner (click to sort) | Address | Description |
|---|---|---|---|
| AZT | NHK Spring Co., Ltd. | 10, Fukuura 3-chome, Kanazawa-ku, Yokohama-shi, Kanagawa 2360004 Japan | Probes for scientific purposes; semiconductor testing apparatus; contact probes for testing semiconductors; probes for testing semiconductors; probes for testing printed circuit boards; probes for testing integrated circuits; probes for testing semiconductor integrated circuit boards; probes for testing circuit boards; parts of probes for testing printed circuit boards, namely, plungers and springs; testing apparatus for testing printed circuit boards; parts of testing apparatus for testing printed circuit boards, namely, plungers and spring; test adapters for testing printed circuit boards; test pins for testing printed circuit boards; |
| ENTROPE | Kabushiki Kaisha Device Lab | Sangaku Liaison Kyodokenkyu Center, 1-1, Tennodai 1-chome, Tsukuba-shi Iba Japan | Probes for scientific purposes; measuring or testing machines and instruments measuring electric noise of semi-conductor devices; probes for scientific purposes for measuring electric noise of semi-conductor devices; Downloadable and recorded computer programs for use in measuring or testing machines and instruments measuring electric noise of semi-conductor devices; Downloadable and recorded computer programs for use in probes for scientific purposes measuring electric noise of semi-conductor devices;Providing temporary use of non-downloadable computer programs on data networks for use in measuring or testing machines and instruments measuring electric noise of semi-conductor devices; providing temporary use of non-downloadable computer programs on data networks for use in probes for scientific purposes measuring electric noise of semi-conductor devices; computer software design, computer programming, and maintenance of computer software, namely, computer programming services for measuring and analysis of electric noise of semi-conductor devices; technical research or scientific laboratory services, namely, measuring and analysis of electric noise of semi-conductor devices; |
| INQUI | Kabushiki Kaisha Sankei Engineering (Sankei Engineering Co., Ltd.) | Davinci Shin-Yokohama 214 2-14-2 Shin-Yokohama Kohoku-ku Yokohama Kanagawa 222-0033 Japan | Probes for scientific purposes, namely, probes for testing electrical attributes of electrical products and electrical components, not used for medical purposes; |
| IT-SENS | Boschung Mecatronic AG | Aéropôle 108 CH-1530 Payerne Switzerland | Probes for scientific purposes, namely, probes for measuring pavement temperature, pavement humidity, and water thickness on pavement, meteorological probes for measuring precipitation, humidity, air temperature, air pressure, range of vision, wind, solar radiation and snow depths; computer software for evaluating measurement values, electronic monitoring installations, namely, pavement and meteorological sensors for ice prevention on roads, underground probes, namely, probes for measuring pavement temperature, pavement humidity, and water thickness on pavement, measuring apparatus, in particular with respect to traffic and the state of roads, namely, temperature, humidity and icing conditions of the pavement;[ Services comprising the compilation and systematization of data in computer data banks ]; |
| MEZEN | Kabushiki Kaisha Sankei Engineering (Sankei Engineering Co., Ltd.) | Davinci Shin-Yokohama 214 2-14-2 Shin-Yokohama Kohoku-ku Yokohama Kanagawa 222-0033 Japan | Probes for scientific purposes, namely, probes for testing electrical attributes of electrical products and electrical components, not used for medical purposes; |
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| NEVENO | Kabushiki Kaisha Sankei Engineering (Sankei Engineering Co., Ltd.) | Davinci Shin-Yokohama 214 2-14-2 Shin-Yokohama Kohoku-ku Yokohama Kanagawa 222-0033 Japan | Probes for scientific purposes, namely, probes for testing electrical attributes of electrical products and electrical components, not used for medical purposes; |
| POCKETCHEF | NUWAVE | 560 Bunker Ct. Vernon Hills IL 60061 | probes for scientific purposes; food safety monitoring devices, namely, electronic thermometers; diagnostic apparatus for testing food; thermometers, not for medical purposes; temperature indicator; measuring instruments, namely, temperature measuring sensors; measuring devices, namely, temperature meters not for medical use; measuring apparatus, namely, temperature measuring apparatuses being thermometers other than for medical use;POCKET CHEF; |
| POEX | Controlled Systems Limited | Ryder Close, Swadlincote Derbyshire DE11 9EU United Kingdom | Probes for scientific purposes, cameras photography, electrical switches, transformers, electrical regulating apparatus, electrical couplings, electrical control panels, sound transmitting apparatus, sound reproduction apparatus, data processing apparatus, computers, weighing apparatus and instruments, material testing instruments and machines; |
| TERALYTIC | TERALYTIC HOLDINGS INC. | Suite 800 222 South Mill Avenue Tempe AZ 85281 | Probes for scientific purposes, namely, agricultural probes for monitoring soil moisture, salinity, aeration, respiration, temperature and humidity; |
| XCELLENTVISION | SHENZHEN XPECTVISION TECHNOLOGY CO., LTD. | Suite 201, Building B52, Tnaglang Ind. No. 13 at No. Five Xinyi Road, Tanglang Shenzhen, Guangdong 518071 China | Probes for scientific purposes; apparatus and installations for the production of x-rays, not for medical purposes; players for sound and image medias; optical sensors; radiation detectors; Clothing for protection against injury from X-rays, not for medical purposes; x-ray photographs, other than for medical purposes;In the statement, line 3-5, should be deleted, and Suite 201, Building B52, Tanglang, Industrial Area, No. 13 at No. Five Xiny, Shenzhen, Guangdong, China should be inserted.;XCELLENT VISION; EXCELLENT VISION;X-ray apparatus for medical purposes; x-ray photographs for medical purposes; radiological apparatus for medical purposes; tomographs for medical purposes; isotope apparatus and instruments for medical diagnosis and treatment; dental apparatus and instruments, namely, X-ray apparatus for dental imaging; apparatus and installations for the production of x-rays, for medical purposes; medical apparatus and instruments in the nature of medical X-ray apparatus; suture materials; protection devices against x-rays, for medical purposes, namely, medical apparatus in the nature of protective barriers for placement around patients; |
| XLINEARVISION | SHENZHEN XPECTVISION TECHNOLOGY CO., LTD. | Suite 201, Building B52, Tnaglang Ind. No. 13 at No. Five Xinyi Road, Tanglang Shenzhen, Guangdong 518071 China | Probes for scientific purposes; apparatus and installations for the production of x-rays, not for medical purposes; Downloadable software for editing images, sounds and videos; Downloadable software for organizing and viewing digital images and photos; players for sound and image medias; cameras with linear image sensors; optical sensors; radiation detectors; Clothing for protection against injury from X-rays, not for medical purposes; x-ray photographs, other than for medical purposes;In the Statement, lines 3 and 4, should be deleted, and, Suite 201, Building B52, Tanglang Industrial Area, No. 13 at No. Five Xinyi Road, Tanglang Community, Taoyuan Str., Nanshan District, Shenzhen, Guangdong 518071 should be inserted.;X LINEAR VISION;X-ray apparatus for medical purposes; x-ray photographs for medical purposes; radiological apparatus for medical purposes; tomographs for medical purposes; isotope apparatus and instruments for medical diagnosis and treatment; dental apparatus and instruments, namely, X-ray apparatus for dental imaging; apparatus and installations for the production of x-rays, for medical purposes; medical apparatus and instruments the nature of medical X-ray apparatus; suture materials; protection devices against X-rays, for medical purposes, namely, medical apparatus in the nature of protective barriers for placement around patients; |
Where the owner name is not linked, that owner no longer owns the brand |
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Technical Examples
- An electronic device is moved into a first position with respect to probes for making electrical contact with the device. The electronic device is then moved into a second position in which the electronic device is pressed against the probes, compressing the probes. The movement into the second position includes two components. One component of the movement tends to press the electronic device against the probes, compressing the probes and inducing a stress in the probes. The second movement tends to reduce that stress. Test data are then communicated to and from the electronic device through the probes.