PROGRAMMABLE LOGIC INTEGRATED CIRCUITS

Brand	Owner (click to sort)	Address	Description
INSTANT ASIC	LIGHTSPEED SEMICONDUCTOR CORPORATION	209 N. Fair Oaks Avenue Sunnyvale CA 94085	programmable logic integrated circuits;ASIC;
MEGAFPGA	Lightspeed Semiconductor, Inc.	5150 El Camino Real Suite A-33 Los Angeles CA 94022	programmable logic integrated circuits;MEGA PGA;
MFPGA	Lightspeed Semiconductor, Inc.	5150 El Camino Real Suite A-33 Los Angeles CA 94022	programmable logic integrated circuits;
RIGHT TRACK	Right Track CAD Corp.	720 Spadina Avenue Suite 313 Toronto, Ontario M5S 2T9 Canada	programmable logic integrated circuits and the associated computer-aided design software tools;programmable logic integrated circuit architecture and design development; evaluating performance of architectures of others; design and development of computer aided design tools for programmable logic integrated circuits; technical consultation and research in the area of programmable logic integrated circuit architectures and associated computer-aided design tools;
SFPGA	Lightspeed Semiconductor, Inc.	5150 El Camino Real Suite A-33 Los Angeles CA 94022	programmable logic integrated circuits;
UFPGA	Lightspeed Semiconductor, Inc.	5150 El Camino Real Suite A-33 Los Angeles CA 94022	programmable logic integrated circuits;
ULTRAFPGA	Lightspeed Semiconductor, Inc.	5150 El Camino Real Suite A-33 Los Angeles CA 94022	programmable logic integrated circuits;ULTRA FPGA;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

Methods and apparatus for testing programmable integrated circuits are provided. Programmable integrated circuits include programmable elements that are loaded with configuration data to program programmable logic to perform a custom logic function. The programmable integrated circuits receive test configuration data from a tester to program the programmable logic into a test configuration. After the programmable integrated circuit has been placed into the test configuration by loading the test configuration data, test vectors are applied to the programmable integrated circuit to evaluate its performance. Test configuration data loading circuits are used in the programmable integrated circuits to control how the test configuration data is loaded into the programmable elements. When the adjustable circuits are placed in a low bandwidth configuration, relatively few input lines are used to load the test configuration data. When the adjustable circuits are placed in a high bandwidth configuration, test data can be loaded quickly.