SEMICONDUCTOR DEVICES TRANSMISSION

Brand Owner Address Description
GIGARAY LATTICE SEMICONDUCTOR CORPORATION 5555 NE Moore Ct Hillsboro OR 97124 Semiconductor devices for transmission and reception of millimeter band radiofrequency communications; computer software for controlling wireless transmitters, receivers and systems; integrated circuits for use in wireless transmitters, receivers, and systems; computer chipsets for use in transmitting data to and from one computer chip to another computer chip; computer hardware and software for transmission of data between source devices and receiver devices; communications hardware, namely, communications servers; computer networking hardware; wireless devices, namely, wireless adapters, network equipment, namely, LAN (local area network) access points for networking computers, namely, for networking computers using millimeter band radiofrequency communications, Wide Area Network (WAN) equipment, namely, transmitters, receivers, and transceivers used to transport data, point-to-point connections, namely, point-to-point connections and mesh connections using millimeter band radio frequencies; high speed communication subsystems comprising a wireless transmitter, and a wireless receiver, namely, a wireless transmitter and a wireless receiver operating in a millimeter radiofrequency band;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An apparatus for detecting concealed surveillance devices coupled to a transmission line uses either a time domain or frequency domain reflectometry operation to locate any impedance anomalies on the transmission line and a non-linear junction detection operation to classify the located impedance anomalies as semiconductor or non-semiconductor based anomalies. The reflectometry operation utilizes the reflection of a test signal to determine the distance to any reflecting impedance anomalies on the transmission line that may be indicative of an electronic device being coupled to the transmission line. The non-linear junction detection operation then compares the amplitudes of re-radiated second and third harmonics of a transmitted fundamental frequency signal to determine if the reflecting impedance anomalies are the result of a semiconductor based non-linear junction. A DC bias voltage and a balanced load may be added to the transmission line to enhance the line's response to the test signals. Any unidentified semiconductor based anomalies are manually inspected to determine if they represent convert surveillance devices.