SEMICONDUCTOR ELECTRICAL CIRCUIT TESTING

Brand	Owner (click to sort)	Address	Description
TEST DRIVE	INTERSIL AMERICAS INC.	675 Trade Zone Boulevard Milpitas CA 95035	SEMICONDUCTOR AND ELECTRICAL CIRCUIT TESTING FOR OTHERS;
TEST DRIVE	INTERSIL AMERICAS INC.	675 Trade Zone Boulevard Milpitas CA 95035	SEMICONDUCTOR AND ELECTRICAL CIRCUIT TESTING FOR OTHERS;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consisting of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between the wafer and electrical testing equipment. A rigid substrate has conductors thereon which establish electrical contact with the wafer. The test fixture need not be opened until the burn-in and electrical testing are completed. After burn-in stress and electrical testing, it is possible to establish interconnection between the single die or separate and package dice into discrete parts, arrays or clusters, either as singulated parts or as arrays.