SOCKETS FOR TESTING SEMI CONDUCTORS

Brand	Owner (click to sort)	Address	Description
3M	3M Company	3M Center, 2501 Hudson Road St. Paul MN 55144	SOCKETS FOR TESTING SEMI-CONDUCTORS;3 M;
ECONO-ZIP	Minnesota Mining and Manufacturing Company	St. Paul MN	SOCKETS FOR TESTING SEMI-CONDUCTORS;
GRID ZIP	Minnesota Mining and Manufacturing Company	St. Paul MN	Sockets for Testing Semi-Conductors;No claim is made to exclusive use of the word Grid apart from the mark as shown.;
ZIP-DIP	Minnesota Mining and Manufacturing Company	St. Paul MN	SOCKETS FOR TESTING SEMI-CONDUCTORS;
ZIP-STRIP	Minnesota Mining and Manufacturing Company	St. Paul MN	SOCKETS FOR TESTING SEMI-CONDUCTORS;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A system for testing with an automated test equipment (ATE). The ATE includes a tester, an interface board connected to the tester, a first socket and a second socket of the interface board, a first manipulator arm connected to the tester, and a second manipulator arm connected to the tester. The first socket and the second socket are parallel-wired to the tester. The ATE also includes a switch connected to the tester and the interface board. The switch selectively effects communicative connection of the tester to either of the first socket or the second socket at each instant. During testing via one of the sockets, one of the manipulator arms moves post-test devices and replaces next devices for testing in the other of the sockets. After testing via one of the sockets is completed, the switch immediately connects the other socket and testing of next devices commences and continues for those devices. The system continuously repeats the movement and replacing of devices in each respective socket during testing of devices at the other socket. Index time for testing with the system is substantially negligible.