SOFT CELL

Brand Owner (click to sort) Address Description
SOF'CELL GRAPHIC CONTROLS CORPORATION 189 Van Rensselaer Street P.O. Box 1271 Buffalo NY 14240 SOFT CELL;VENTILATED TAPE FOR MEDICAL MONITORING ELECTRODES;
SOF-CELL FLEXI-MAT CORPORATION 14420 Van Dyke Road Plainfield IL 60544 SOFT CELL;MATTRESSES;
SOFT-CELL C. R. BARD, INC. 1 Becton Drive Franklin Lakes NJ 07417 SOFT CELL;Medical and surgical catheters;
SOFTCELL HUNTER DOUGLAS INC. 1 Blue Hill Plaza, 20th Floor Pearl River NY 10965 SOFT CELL;window coverings; namely, shades and blinds and non-metal clips, non-metal brackets, non-metal handles for curtains, curtain rails, non-metal clamps, non-metal hooks, plastic knobs and non-metal curtain rings, non-metal end caps for windows, blinds and doors, window blind tracks and supports;
SOFTCELL Genlythe Thomas Group 4360 Brownsboro Road Louisville KY 40232 SOFT CELL;fluorescent lighting fixtures and louvers for lighting fixtures;
SOFTCELL Source Northwest, Inc. 8329 - 216th Street, S.E. Woodinville WA 98072 SOFT CELL;window treatments namely, blinds, shades, and interior window shutters;
SOFTCELL Metry Companies 4696-126th Street North White Bear Lake MN 55110 SOFT CELL;Portable water softener, namely, a water softening unit;
SOFTCELL Fabrictech 2000 Suite 1 1402 S. 40th Avenue Phoenix AZ 85009 SOFT CELL;pillows;
SOFTCELL VISTA OUTDOOR OPERATIONS 1 Vista Way Anoka MN 55303 SOFT CELL;Component parts for ammunition;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Provided are a semiconductor integrated circuit including a unit which detects soft defects in a pull-up circuit of a static memory cell, and a soft defect detection method and a testing method thereof. The semiconductor integrated circuit includes a static memory cell, a bit line connected to a first node of the static memory cell and a complementary bit line connected to a second node of the static memory cell, and an equalization circuit connected to the bit line and the complementary bit line to equalize the bit line and the complementary bit line in response to a test signal during a test mode. The semiconductor integrated circuit and the soft defect detection method can rapidly detect soft defects in the pull-up circuit of the static memory cell without a retention test. Furthermore, the testing method can rapidly detect soft defects in the pull-up circuit of the static memory cell, allowing the test time to be drastically reduced.