STRAUSS OPTICS

Brand	Owner (click to sort)	Address	Description
STRAUSS OPTIKS	STRAUSS SURGICAL	3020 NW 82ND AVE. MIAMI FL 33122	STRAUSS OPTICS;The foreign wording in the mark translates into English as OPTICS.;Endoscopic equipment; Rigid and flexible medical endoscopes; Medical and surgical laparoscopes; Surgical and medical apparatus and instruments for use in general surgery; Surgical apparatus and instruments for medical, dental or veterinary use; Surgical instruments and apparatus; Surgical instruments for use in orthopedic and spinal surgery;OPTIKS;
STRAUSS OPTIKS	BOURLAND, CHARLES R.	3020 NW 82 AVENUE MIAMI FL 33122	STRAUSS OPTICS;The foreign wording in the mark translates into English as OPTICS.;Endoscopic equipment; Rigid and flexible medical endoscopes; Medical and surgical laparoscopes; Surgical and medical apparatus and instruments for use in general surgery; Surgical apparatus and instruments for medical, dental or veterinary use; Surgical instruments and apparatus; Surgical instruments for use in orthopedic and spinal surgery;OPTIKS;
STRAUSS OPTIKS	STRAUSS SURGICAL	3020 NW 82nd Ave. Miami FL 33122	STRAUSS OPTICS;Medical devices, namely, scopes for medical and surgical procedures, namely, endoscopes, laparoscope intubation scopes, cystoscopes, arthroscopes, sinuscopes, spinal endoscopes, TMJ endoscopes, nephroscopes, ureterorenoscopes, bronchoscopes, nasolaryngoscopes, and structural parts therefor;OPTICS;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A system for probe-less non-invasive detection of electrical signals from integrated circuit devices is disclosed. The system includes an illumination source, collection optics, imaging optics, and a photon sensor. In a navigation mode, the light source is activated and the imaging optics is used to identify the target area on the chip and appropriately position the collection optics. Once the collection optics is appropriately positioned, the light source is deactivated and the photon sensor is used to detect photons emitted from the chip. No mention of cooling (active device measurement capability) and advanced optics to detect the features (SIL).