TEST MEASUREMENT MACHINES

Brand Owner Address Description
VCC HORIBA STEC, CO., LTD. 11-5, Hokodate-cho, Kamitoba, Minami-ku Kyoto 601-8116 Japan Test and measurement machines and instruments, namely, technical measuring, testing and checking apparatus and instruments for measuring, testing and checking the quantity of fluid flow, fluid pressure, fluid concentration, gas concentration of gas and liquids; fluid measurement apparatuses, namely, gas concentration meters; fluid flow controllers, namely, automatic fluid flow control machines for use in controlling a gas concentration; fluid flow meters; fluid flow sensors, namely, electronic sensors for measuring fluid flow; pressure controllers, namely, electronic pressure control systems for machines for use in controlling a gas concentration; pressure meters, namely, pressure meters indicators for use in controlling a gas concentration; pressure sensors; concentration controllers, namely, electronic control systems for machines for regulating gas concentration; concentration meters; concentration sensors, namely, gas sensors for measuring gas concentration; gas concentration controllers, namely, electronic control systems for machines for regulating gas concentration; gas concentration meters; gas concentration sensors, namely, gas sensors for measuring gas concentration; laboratory apparatuses and instruments, namely, electric sensors, for use in measuring fluid flow, fluid pressure, fluid concentrations, gas concentrations; electronic machines, apparatuses and their parts, namely, electronic data processing apparatuses, for use in measuring fluid flow, fluid pressure, fluid concentrations, gas concentrations; computer programs for use in operating equipment for measuring fluid flow, fluid pressure, fluid concentrations, gas concentrations; gas sensors for measuring gas concentration; and automatic gas concentration control machines and instruments, namely, automatic computer-controlled apparatus for measuring concentration of gas for use with machines for manufacturing semiconductors, solar cells, light-emitting diodes, displays, liquid crystal and organic electroluminescent elements;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An operating environment of a measurement apparatus for measuring semiconductor devices under test. In particular, a measurement apparatus for a device under test and a method using the measurement apparatus in which a user can promptly and easily understand the selection of the semiconductor measurement-evaluation application used for measuring the device under test, the setting of parameters used during execution, the display of the execution and the result of the execution, and the programming-related operations.