TESTING APPARATUS FOR TESTING

Brand	Owner	Address	Description
PDA-H	ONTARIO HYDRO	700 University Avenue Toronto, Ontario M5G IX6 Canada	TESTING APPARATUS FOR TESTING THE CONDITION OF INSULATION IN HYDROGENERATORS BY PARTIAL DISCHARGE ANALYSIS;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

Auto-recovery wafer testing apparatus and wafer testing method are provided. The wafer testing apparatus includes a main system, a tester and a real-time accessing module. The main system controls the process of the wafer testing. The tester is electrically coupled to the main system for receiving commands from the main system to perform testing on a plurality of chips sequentially and output the testing data correspondingly. The real-time accessing module is electrically coupled to the tester for simultaneously accessing the testing data. In an event when the testing is accidentally interrupted, the tester can produce auto-recovery data according to the testing data saved in the real-time accessing module, and continue testing, based on the auto-recovery data, from the chip being last but incompletely tested. The use of the wafer testing apparatus and method can save testing time and enhance the production efficiency.