TWO OR MORE LAYER COMPOSITE

Brand Owner (click to sort) Address Description
DURA SPUN JOHNS MANVILLE INTERNATIONAL, INC. PO Box 5108 717 Seventeenth Street Denver CO 80202 two or more layer composite materials, made of glass fiber nonwovens and polymer fiber nonwovens; carrier webs, made of glass fiber nonwovens and polymer fiber nonwovens, particularly for use in roofing membranes, roofing felts and floor coverings; roofing membranes, roofing felts and floor coverings, made of glass fiber nonwovens and polyester nonwovens, particularly as bituminized roofing felts and laminated floor coverings; shingles, made of glass fiber nonwovens and polyester nonwovens, particularly bituminized shingles;
DURABLOCK JOHNS MANVILLE 717 17th Street Denver CO 80202 Two or more layer composite materials, made of glass fiber nonwovens and polymer fiber nonwovens specifically for use as a landscape and weed barrier;DURABLE BLOCK;
DURASPUN JOHNS MANVILLE 717 17th Street Denver CO 80202 Two or more layer composite materials, made of glass fiber nonwovens and polymer fiber nonwovens for building construction purposes, namely, roofing membranes, roofing felts and bituminized roofing felts made of glass fiber nonwovens and polymer fiber nonwovens; shingles and bituminized shingles made of glass fiber nonwovens and polymer fiber nonwovens;DURABLE SPUN;
EVALITH JOHNS MANVILLE 717 17th Street Denver CO 80202 Two or more layer composite materials, made of glass fiber nonwovens and polymer fiber nonwovens for building construction purposes, namely, roofing membranes, roofing felts and bituminized roofing felts made of glass fiber nonwovens and polymer fiber nonwovens, shingles and bituminized shingles made of glass fiber nonwovens and polymer fiber nonwovens; polyester roofing reinforcement mat used in connection with bitumen-based roofing membrane products;Nonwoven textiles, particularly for filtration purposes; filter and filter materials based on nonwoven textiles;Filtration media used for the production of industrial/commercial bag filters;Spunbond filtration media for use in the purification of water, fiber glass filtration media for industrial/commercial use in the purification of air;
EVALITH JOHNS MANVILLE 717 17th Street Denver CO 80202 Two or more layer composite materials, made of glass fiber nonwovens and polymer fiber nonwovens for building construction purposes, namely, roofing membranes, roofing felts and bituminized roofing felts made of glass fiber nonwovens and polymer fiber nonwovens, shingles and bituminized shingles made of glass fiber nonwovens and polymer fiber nonwovens, polyester roofing reinforcement mat used in connection with bitumen-based roofing membrane products;Nonwoven textiles, particularly for filtration purposes, filter and filter materials based on nonwoven textiles;Filtration media used for the production of industrial/commercial bag filters;Spunbond filtration media for use in the purification of water, fiber glass filtration media for industrial/commercial use in the purification of air;
PROTECTING GREAT ROOFS JOHNS MANVILLE 717 17th Street Denver CO 80202 two or more layer composite materials, made of glass fiber nonwovens and polymer fiber nonwovens; carrier webs, made of glass fiber nonwovens and polymer fiber nonwovens, particularly for use in roofing membranes, roofing felts and floor coverings; roofing membranes, roofing felts and floor coverings, made of glass fiber nonwovens and polyester nonwnvens, particularly as bitminized roofing felts and laminated floor coverings; shingles, made of glass fiber nonwovens and polyester nonwovens, particularly bituminzed shingles;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Systems and/or methods are disclosed for aligning multiple layers of a multi-layer semiconductor device fabrication process and/or system utilizing a composite alignment mark. A component is provided to form the composite alignment mark, such that a first portion of the composite alignment mark is associated with a layer of the wafer and a second portion of the composite alignment mark is associated with a disparate layer of the wafer. An alignment component is utilized to align a reticle for a layer to be patterned to the composite alignment mark.