X RAY FLUORESCENCE ANALYZER

Brand Owner (click to sort) Address Description
EXTOPE Hitachi High-Tech Corporation 17-1, Toranomon 1-chome, Minato-ku Tokyo 105-6409 Japan X-ray fluorescence analyzer; spectrometer; semiconductor testing apparatus; downloadable image processing software for X-ray fluorescence analyzer and operating system software for X-ray fluorescence analyzer; downloadable image processing software for spectrometer and operating system software for spectrometer; downloadable image processing software for electronic imaging platforms in the field of semiconductor materials, namely, downloadable image processing software for semiconductor wafers and reticles; downloadable operating system software for electric imaging platforms in the field of inspection of semiconductor materials, namely, downloadable operating system software for electric imaging platforms that facilitates the inspection of semiconductor wafers and reticles; downloadable image processing software for electron microscopes and operating system software for electron microscopes; electron microscopes;Repair or maintenance of X-ray fluorescence analyzer; repair or maintenance of spectrometer; repair or maintenance of electron microscopes; repair or maintenance of semiconductor testing apparatus;
MESA HORIBA, LTD 2, Miyanohigashi-cho,Kisshoin, Minami-ku Kyoto-shi Kyoto 601-8510 Japan X-ray fluorescence analyzer;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An optical device for directing optical signals in a fluorescence-based analyzer having first and second laser light sources for providing illuminating laser light at different wavelengths. The device comprises a band pass laser filter associated with each laser and arranged to allow laser light of the relevant wavelength of its associated laser to pass therethrough but to reflect light of other wavelengths, each band pass filter being arranged to direct laser light from both of the lasers into a single path directed at a sample to be illuminated in use. At least two fluorescence band pass filters are provided, each of which is arranged to allow light of a selected fluorescent wavelength therethrough. The laser band pass filters are arranged to reflect fluorescent light received from the sample towards the fluorescence filters such that, in use, light received from the sample is allowed to pass through a first of the fluorescence filters if it is at a first wavelength, and through the second of the fluorescence filters if it is at a second wavelength to provide an output signals for analysis at the output of each of the fluorescence.