X RAY MICROANALYSIS SYSTEMS

Brand Owner (click to sort) Address Description
INCA OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLSLIMITED Tubney Woods Abingdon, Oxon OX13 5QX United Kingdom X-RAY MICROANALYSIS SYSTEMS, CONSISTING OF INSTRUMENTS FOR DETECTING, MEASURING AND EVALUATING X-RAYS, ELECTRON IMAGES AND SIGNALS EMITTED AND PROJECTED BY SAMPLES WHEN STRUCK BY THE BEAM OF AN ELECTRON MICROSCOPE; PARTICLE ANALYZERS; SIGNAL PROCESSORS; RADIATION ANALYZERS; LIGHT ELEMENT DETECTORS; X-RAY ANALYZERS;
INCA LINK ANALYTICAL HALIFAX ROAD HIGH WYCOMBE HP12 3SE X-RAY MICROANALYSIS SYSTEMS, CONSISTING OF INSTRUMENTS FOR DETECTING, MEASURING AND EVALUATING X-RAYS, ELECTRON IMAGES AND SIGNALS EMITTED AND PROJECTED BY SAMPLES WHEN STRUCK BY THE BEAM OF AN ELECTRON MICROSCOPE; PARTICLE ANALYZERS; SIGNAL PROCESSORS; RADIATION ANALYZERS; LIGHT ELEMENT DETECTORS; X-RAY ANALYZERS;
SEMEDX OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLSLIMITED Tubney Woods Abingdon, Oxon OX13 5QX United Kingdom X-RAY MICROANALYSIS SYSTEMS, CONSISTING OF X-RAY DETECTORS, COMPUTER HARDWARE AND COMPUTER SOFTWARE THEREFORE, FOR DETECTING, MEASURING AND EVALUATING X-RAYS, ELECTRON IMAGES AND SIGNALS EMITTED AND PROJECTED BY SAMPLES WHEN STRUCK BY THE BEAM OF AN ELECTRON MICROSCOPE, NOT FOR USE IN THE MEDICAL FIELD; PARTICLE ANALYZERS; SIGNAL PROCESSORS; RADIATION ANALYZERS; LIGHT ELEMENT DETECTORS; AND X-RAY ANALYZERS;
 

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Technical Examples
  1. A method for preparing a specimen for application of microanalysis thereto includes forming an initial conductive layer over a defined area of interest on a semiconductor substrate, the initial conductive layer formed through an electron beam deposition process. A volume of substrate material surrounding the area of interest is removed, thereby forming the specimen, including said area of interest and said initial conductive layer over the area of interest. The specimen is then removed from the bulk substrate material.