COMPUTATIONAL PARALLEL INSPECTION

Welcome to the Brand page for “COMPUTATIONAL PARALLEL INSPECTION”, which is offered here for Electro-optical instruments for use in inspection and measurement of industrial components; optical inspection apparatus for inspection of semiconductor materials, semiconductor wafers, reticles, and photomasks; an optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware;inspection;.

Its status is currently believed to be active. Its class is unavailable. “COMPUTATIONAL PARALLEL INSPECTION” is believed to be currently owned by “Exnodes Inc.”


Owner:
EXNODES INC.
Owner Details
Description:
Electro-optical instruments for use in inspection and measurement of industrial components; Optical inspection apparatus for inspection of semiconductor materials, semiconductor wafers, reticles, and photomasks; An optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware;INSPECTION;
Categories: ELECTRO OPTICAL INSTRUMENTS USE