Brands and Their Owners
Welcome to the Brand page for “EOI”, which is offered here for Optical based measurement devices for use in ascertaining the surface features, contour, or shape of an object; optical sensors for high speed dimensional measurements of precision parts; optical sensors for use in the assembly of electronics; non-contact optical sensors for use in the assembly of electronics; solder paste inspection systems for inspecting and measuring solder paste on circuit boards and software therefor, optical sensors and associated computer hardware and software; non-contact inspection system comprised of a sensor with a light source, lenses and optical detectors for three dimensional measurement used during the manufacturing process of precision parts; machine vision system comprising component optical sensors and computer hardware and software; sensors for use in component placement and inspection systems; optical wafer mapping sensors for detecting wafers in wafer processing systems;.
Its status is currently believed to be active. Its class is unavailable. “EOI” is believed to be currently owned by “CYBEROPTICS CORPORATION”.
Owner: |
CYBEROPTICS CORPORATION
Owner Details |
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Description: |
OPTICAL BASED MEASUREMENT DEVICES FOR USE IN ASCERTAINING THE SURFACE FEATURES, CONTOUR, OR SHAPE OF AN OBJECT; OPTICAL SENSORS FOR HIGH SPEED DIMENSIONAL MEASUREMENTS OF PRECISION PARTS; OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; NON-CONTACT OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; SOLDER PASTE INSPECTION SYSTEMS FOR INSPECTING AND MEASURING SOLDER PASTE ON CIRCUIT BOARDS AND SOFTWARE THEREFOR, OPTICAL SENSORS AND ASSOCIATED COMPUTER HARDWARE AND SOFTWARE; NON-CONTACT INSPECTION SYSTEM COMPRISED OF A SENSOR WITH A LIGHT SOURCE, LENSES AND OPTICAL DETECTORS FOR THREE DIMENSIONAL MEASUREMENT USED DURING THE MANUFACTURING PROCESS OF PRECISION PARTS; MACHINE VISION SYSTEM COMPRISING COMPONENT OPTICAL SENSORS AND COMPUTER HARDWARE AND SOFTWARE; SENSORS FOR USE IN COMPONENT PLACEMENT AND INSPECTION SYSTEMS; OPTICAL WAFER MAPPING SENSORS FOR DETECTING WAFERS IN WAFER PROCESSING SYSTEMS;
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Categories: | OPTICAL BASED MEASUREMENT DEVICES |