EOI

Welcome to the Brand page for “EOI”, which is offered here for Optical based measurement devices for use in ascertaining the surface features, contour, or shape of an object; optical sensors for high speed dimensional measurements of precision parts; optical sensors for use in the assembly of electronics; non-contact optical sensors for use in the assembly of electronics; solder paste inspection systems for inspecting and measuring solder paste on circuit boards and software therefor, optical sensors and associated computer hardware and software; non-contact inspection system comprised of a sensor with a light source, lenses and optical detectors for three dimensional measurement used during the manufacturing process of precision parts; machine vision system comprising component optical sensors and computer hardware and software; sensors for use in component placement and inspection systems; optical wafer mapping sensors for detecting wafers in wafer processing systems;.

Its status is currently believed to be active. Its class is unavailable. “EOI” is believed to be currently owned by “CYBEROPTICS CORPORATION”.


Owner:
CYBEROPTICS CORPORATION
Owner Details
Description:
OPTICAL BASED MEASUREMENT DEVICES FOR USE IN ASCERTAINING THE SURFACE FEATURES, CONTOUR, OR SHAPE OF AN OBJECT; OPTICAL SENSORS FOR HIGH SPEED DIMENSIONAL MEASUREMENTS OF PRECISION PARTS; OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; NON-CONTACT OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; SOLDER PASTE INSPECTION SYSTEMS FOR INSPECTING AND MEASURING SOLDER PASTE ON CIRCUIT BOARDS AND SOFTWARE THEREFOR, OPTICAL SENSORS AND ASSOCIATED COMPUTER HARDWARE AND SOFTWARE; NON-CONTACT INSPECTION SYSTEM COMPRISED OF A SENSOR WITH A LIGHT SOURCE, LENSES AND OPTICAL DETECTORS FOR THREE DIMENSIONAL MEASUREMENT USED DURING THE MANUFACTURING PROCESS OF PRECISION PARTS; MACHINE VISION SYSTEM COMPRISING COMPONENT OPTICAL SENSORS AND COMPUTER HARDWARE AND SOFTWARE; SENSORS FOR USE IN COMPONENT PLACEMENT AND INSPECTION SYSTEMS; OPTICAL WAFER MAPPING SENSORS FOR DETECTING WAFERS IN WAFER PROCESSING SYSTEMS;
Categories: OPTICAL BASED MEASUREMENT DEVICES