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Welcome to the Brand page for “EPIC”, which is offered here for Metrology system for the analysis and determination of properties such as thickness and optical constants of films on samples such as semiconductor wafers using different optical technologies for film analysis such as fourier transform infrared (ftir), visible and ultraviolet (uv) reflectometry;.
Its status is currently believed to be active. Its class is unavailable. “EPIC” is believed to be currently owned by “Nanometrics Incorporated”.
| Owner: |
NANOMETRICS INCORPORATED
Owner Details |
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| Description: |
Metrology system for the analysis and determination of properties such as thickness and optical constants of films on samples such as semiconductor wafers using different optical technologies for film analysis such as Fourier Transform Infrared (FTIR), visible and ultraviolet (UV) reflectometry;
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| Categories: | METROLOGY SYSTEM ANALYSIS |