FF

Welcome to the Brand page for “FF”, which is offered here for The mark consists of two stylized letter f's. both f's are at an angle, facing each other with one f positioned upside-down.;probe stations for testing and inspecting integrated circuits and semiconductor devices; probe heads for testing integrated circuits and semiconductor devices; probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; probes for testing of integrated circuits and semiconductor devices; probes for the measurement of electronic signals; probe cards for inspecting integrated circuits and semiconductor devices; waveguide probes for on-wafer probing of circuits; positioners for probing microelectronic assemblies; testing, inspection and probing apparatus, testing, inspection, and probing instruments, computer hardware, and computer software for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuits; optical inspection apparatus for semiconductor devices and integrated circuits; computer software for testing and inspecting integrated circuits; computer software for calibrating probes and probe stations; computer software for use in operating semiconductor and integrated circuit testing machines; testing, inspection and probing instruments for electronic reliability testing of integrated circuits and semiconductor devices;ff form factor;color is not claimed as a feature of the mark.;.

Its status is currently believed to be active. Its class is unavailable. “FF” is believed to be currently owned by “FORMFACTOR, INC.”


Owner:
FORMFACTOR, INC.
Owner Details
Description:
The mark consists of two stylized letter F's. Both F's are at an angle, facing each other with one F positioned upside-down.;probe stations for testing and inspecting integrated circuits and semiconductor devices; probe heads for testing integrated circuits and semiconductor devices; probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; probes for testing of integrated circuits and semiconductor devices; probes for the measurement of electronic signals; probe cards for inspecting integrated circuits and semiconductor devices; waveguide probes for on-wafer probing of circuits; positioners for probing microelectronic assemblies; testing, inspection and probing apparatus, testing, inspection, and probing instruments, computer hardware, and computer software for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuits; optical inspection apparatus for semiconductor devices and integrated circuits; computer software for testing and inspecting integrated circuits; computer software for calibrating probes and probe stations; computer software for use in operating semiconductor and integrated circuit testing machines; testing, inspection and probing instruments for electronic reliability testing of integrated circuits and semiconductor devices;FF FORM FACTOR;Color is not claimed as a feature of the mark.;
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